Low Temperature Scanning Probe Microscopes Low Temperature Scanning Probe Microscopes Cryogenic Atomic Force Microscopes © 2010, attocube systems AG - Germany. attocube systems and the logo are trademarks of attocube systems AG. Registered and/or otherwise protected in various countries where attocube systems products are sold or distributed. Other brands and names are the property of their respective owners. attocube systems AG | Königinstrasse 11a (Rgb) | D - 80539 München | Germany Tel.: +49 89 2877 809 - 0 | Fax: +49 89 2877 809 - 19 | [email protected] www.attocube.com Brochure version: 2010 - 01 attocube systems explore your nanoworld attocube systems explore your nanoworld

Atomic force MICROSCOPY (AFM I, AFM III, AFM/STM, AFM/CFM) Atomic Force Microscopy (AFM) is the method of choice for surface characterization in various fields of research, ranging from biology to life- and material science. AFM is an extremely accurate and versatile instrument enabling the investigation of surface topography, tip-sample interaction forces, and magnetic surface phenomena (MFM). The Atomic Force Microscope (AFM) was an offspring of the Scanning Tunneling Microscope (STM) designed to measure the topography of a nonconductive sample. The AFM has undergone several enhancements over...

PRODUCT KEY FEATURES > ultra compact AFM head > highly sensitive interferometric deflection detection > unreached stability > optical inspection of sample / tip via CCD camera > adjustment of the cantilever outside the cryostat prior to cooling the microscope LOW TEMPERATURE ATOMIC FORCE MICROSCOPE, cantilever based Principle - The microscope uses a set of xyz-positioners for coarse positioning of the sample over a range of several mm. Developed particularly for cryogenic applications, the piezo scanner ANSxy100 provides a scan range of 30 x 30 μm2 even at liquid helium temperature. In the attoAFM I...

PRODUCT KEY FEATURES > ultra compact AFM head with unprecedented stability > highly sensitive, non-optical tuning fork sensor > LT compatible preamplifier located in close proximity to tuning fork LOW TEMPERATURE SCANNING, tuning fork based Principle - the attoAFM III uses a tuning fork sensor as detection mechanism for the tip-sample separation, allowing high resolution non-contact mode imaging without the need for any optical deflection detection techniques. An AFM tip is glued onto one leg of a small quartz tuning fork and forced to oscillate in horizontal direction with an amplitue of typically...

04 attoAFM/STM COMBINED LOW TEMPERATURE ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPE, tuning fork based Principle - The attoAFM/STM typically uses an ultra-sharp etched tungsten tip as a probe. The tip is glued onto the tuning fork and electrically connected to a current/voltage amplifier located on top of the experiment. A low temperature, high-vacuum compatible coaxial cable is used for this connection, guaranteeing minimum noise pickup. The instrument can be operated in AFM, STM, or combined AFM & STM mode. In the attoAFM/STM, the two worlds of atomic force and scanning tunneling microscopy...

05 attoAFM/CFM COMBINED LOW TEMPERATURE ATOMIC FORCE AND CONFOCAL MICROSCOPE, tuning fork based Principle - The attoAFM/CFM uses an Akiyama probe tip to investigate tip-sample interaction forces on the nanometer scale. The Akiyama probe is typically operated in non-contact mode using a phase-locked loop to excite the probe at resonance and track any shift in frequency due to tip-sample interactions. An additional PI controller keeps the frequency shift at a constant value while scanning over the surface. Simultaneously to the information provided by the Akiyama probe, the CFM reveals complementary...

Scan Engine: The ASC500 uses a dedicated hardware with a 5 MHz scan generator, creating the scan voltages necessary for any Scanning Probe Microscope. The 16 bits of the xy outputs are always automatically mapped to the actual scan field, yielding a virtually unlimited bit resolution. FULLY DIGITAL SPM CONTROLLER The ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with innovative software architecture, offering superior performance and an unprecedented variety of control concepts. The ASC500 controller was developed with the goal to never be the...

07 ATTOCUBE SYSTEMS’ MICROSCOPES Open up New Possibilities 2Δ = 2.8mV normalized dI/dV The data were generously provided by S. Heun et. al., NEST, CNR-INFM and Scuola Normale Superiore, Pisa, Italy. 500nm AFM contact mode image of a Si-substrate/SiO2-layer. Height: 20 ± 2 nm recorded at 10 K using a closed cycle pulse tube cooler. The images were recorded with the cooler on (attocube application labs, 2007). 6 µm The ANC250 is a dedicated, ultra low noise scan voltage amplifier for piezo scanning tubes and flexure scanners. With an output noise of 20 µVRMS @ a 500 kHz bandwidth, the ANC250 offers...