T940 - 8 Pages

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T940

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Astronics Test Systems Inc. Talon Instruments™ 50 MHz Digital Resource Module The Talon Instruments™ T940 Digital Resource Module (DRM) provides up to 64 high-performance digital I/O channels in a space-saving single-wide VXI 4.0 compatible module. The T940 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and <3 ns channel-to-channel skew. Key Features • 50 MHz digital stimulus and response with 1 ns edge placement resolution • Engineered for reliability with an advanced thermal design, temperature monitoring, and over-temperature shutdown • Innovative software tools to speed test development • Scalable design supports synchronized digital test systems from 24 to 768 channels • High-speed data sequencer provides control of stimulus/ response patterns • Optional software tools simplify legacy replacement and preserve TPS investment Product Information The T940 series of digital modules for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/avionics, weapons systems, spacecraft, semiconductors and medical devices. We exploit the VXI 3.0 and 4.0 platforms to produce highly-capable and reliable digital subsystems that are backed by our proprietary digital sequencer architecture. The T940 has been designed using Field Programmable Gate Arrays (FPGA) and pin-driver technologies plus an advanced sequencer, providing a choice of fixed or variable driver/receiver personality modules to create flexible digital instrumentation. Mix and Match Driver/Receiver Modules for Value When configuring a digital subsystem, combine an appropriate VXI mainframe/ controller, configured T940 modules that include the Digital Resource Module (DRM) and your choice of Driver/Receiver (DR) daughter cards to meet the physical interface requirements, and software. T940 DRM features dual sequencers that can each operate in standalone or linked modes automatically with software commands. DR card types include a full selection of variable-voltage and fixed-voltage types, including LVDS, LVTTL, and RS-485. 949.859.8999; 800.722.2528; atssales@astronics.com; www.astronicstestsystems.com Copyright © 2014 Astronics Test Systems Inc. Applications for a Digital Subsystem The T940 modules form the backbone of a digital subsystem that may include switching, analog instrumentation, and even an RF subsystem. The proven VXIbus instrumentation platform is a time-tested approach for facilitating the integration of these different technologies at the device level by allowing the free mixing of T940 modules with other VXI modules for added functionality. In addition, the T940 modules can be preintegrated at the subsystem level suited to a specific application. The Racal Instruments™ 1263 series and 1261B series mainframes, switching products, and other instrumentation integrate with the T940 to meet many stimulus/response needs. If requirements are provided to us, we can propose either a subsystem or a fully integrated system to perform functional testing on a variety of complex Devices Under Test (DUTs), including satellites, weapons systems, aircraft LRUs/SRUs, and certain classes of semiconductor devices. We are uniquely positioned to provide solutions from the device level to the turnkey system level, including all hardware and software spanning the test development tools, including the Test Program Set (TPS) itself. Designed for High Reliability The T940 employs comprehensive thermal design to ensure reliability with excellent cooling, monitoring, and protection.

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Astronics Test Systems Inc. Product Information and UR14 employ a large heat sink, but there is also an on-board temperature monitor that protects the pin electronics from overheating and provides over- temperature shutdown. An optional Racal Instruments™ 1263HP series high-power chassis provides the additional power and cooling required for large digital test systems. Advanced Features for Modern Digital Test Development The T940's innovative design is suitable for today's challenging digital test system applications. The flexible FPGA design enables the T940 to meet special user and...

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Astronics Test Systems Inc. Product Information continued VIVA™ Debugger • Full drive current on all channels simultaneously when used with our 1263HP series mainframes The optional VIVA™ Debugger provides an interactive environment to control test program execution during debug. The debugger supports enabling or disabling test execution, repeating, looping, step-bystep execution, and much more. • Programmable current load with dual commutating voltages • Programmable resistive input load to a programmed voltage • Program slew rates selectable per channel (0.2 V/ns to 1.3 V/ns, typical) •...

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Astronics Test Systems Inc. Product Information USER PROJECT VISUAL STUDIO Soft Front DRIVER LAYERS Figure 6: Third-party test development tools Legacy Replacement Configurations The T940-UR14 replaces a legacy central resources board. variable-voltage I/O cards with 48 analog test channels. cards when analog test channels are not used with or without theT940-UR14 as master because it can provide its own probe, clock, and external pause/halt I/O. Note: The Astronics Test Systems policy is one of continuous development and improvement. Consequently, the equipment may vary in detail from the...

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Astronics Test Systems Inc. Specifications continued Pattern (Stimulus/Expect) Data • Output: H, L, Tristate • Expect: Good 1, Good 0, OK , between or mask • Keep last • Toggle last • Accumulate a CRC16 or CRC32 (based on a Good 1 only) Recording Mode Recording Modes (per sequence step) • Record errors for programmable inputs that have a Good 1 and Good 0 • Record errors for single-ended inputs that have only a Good 1 • Record raw data based on NOT a Good 0 • Record raw data based on a Good 1 Sequencer Characteristics General • Sequencers: 2 per Digital Resource Module • Channels: 32 per...

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