PXIe-6943
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50 MHz Digital Test Instrument The PXIe-6943 Digital Test Instrument (DTI) provides 32 high-performance digital I/O channels in a space-saving, single-wide PXI Express compatible module. The PXIe-6943 DTI operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and <3 ns channel-to-channel skew. Product Information The PXIe-6943 DTI for PXI Express provides the basis for a complete state-of-the-art digital solution at the subsystem level. The PXIe-6943 is the solution for both legacy digital replacement and new digital test stations for applications including aircraft/avionics, weapons systems, spacecraft, semiconductors and medical devices. Applications for a Digital Subsystem The PXIe-6943 DTI forms the backbone of a digital subsystem that may include switching, analog instrumentation, and even an RF subsystem. The proven PXI instrumentation platform is a time-tested approach for facilitating the integration of these different technologies at the device level by allowing the free mixing of PXIe-6943 modules with other PXI modules for added functionality. In addition, the PXIe-6943 modules can be pre-integrated at the subsystem level suited to a specific application. Astronics Test Systems offers custom design and integration services to create subsystems or fully integrated systems for functional testing on a variety of complex Devices Under Test (DUTs), including satellites, weapons systems, aircraft LRUs/ SRUs, and certain classes of semiconductor devices. From devices to turnkey systems, Astronics Test Systems can deliver all hardware and software solutions, including the Test Program Set (TPS) itself. Designed for High Reliability The PXIe-6943 DTI employs comprehensive thermal design to ensure reliability with excellent cooling, monitoring, and protection. The pin electronics devices on the PXIe-6943 employ a large heat sink, and there is also on-board temperature monitoring that protects the pin electronics from overheating and provides over-temperature shutdown. • 50 MHz digital stimulus and response with 1 ns edge placement resolution • Engineered for reliability with an advanced thermal design, temperature monitoring, and over-temperature shutdown • Innovative software tools to speed test development • Scalable design supports synchronized digital test systems from 32 to 224 channels • High-speed data sequencer provides control of stimulus/ response patterns • Optional software tools simplify legacy replacement and preserve TPS investment TEST SOLUTIONS

Product Information (continued) Advanced Features for Modern Digital Test Development The PXIe-6943 DTI's innovative design is suitable for today's challenging digital test system applications. The flexible FPGA design enables the PXIe-6943 to meet special user and legacy requirements. The high-speed data sequencer provides control over test patterns, timing, and format. Robust Protection Circuitry All channels can source and sink current as well as dissipate heat providing loading and high slew rates. To ensure that all channels are operating in a safe area, protection circuitry is...

Product Information (continued) Sequencer logic supports full Unit Under Test (UUT) handshaking and controls timing, format, pattern data, looping, and conditional testing. The sequencer includes definable standby and idle sequences. Variable Voltage Driver/Receiver The PXIe-6943 provides 32 single-ended channels in a single plug-in module. Each channel has the following attributes: • Driver/receiver levels from -2 V to +7 V with an output swing of up to > 7 V • Full drive current on all channels simultaneously (within backplane current limits) • PMU functions including FV MI, FI MV,...

Each PXIe-6943 channel is fitted with a Parametric Measurement Unit (PMU) capable of forcing a voltage or current and measuring the resultant current or voltage. Each PMU channel is equipped with a programmable current and voltage clamp for use in force voltage or force current mode, respectively. Specifications Note: The Astronics Test Systems policy is one of continuous development and improvement. Consequently, the equipment may vary in detail from the description and specifications in this publication. Please contact Astronics Test Systems for more information on how to configure...

Master Clock (continued) Sequence Loop Counters • Loop Counters: 16, nestable • Loop Count can be different each time (1 to 64 k) or continuous. • Loop counters can be optionally re-loaded during a burst. • Only one can end on a sequence step. Subroutine Characteristics • Output one or more Sequence Steps with or without looping. Cannot be nested. Has a designated "Return" Step. Burst Count Range • 1 to 1 M or continuous Jump Types • Conditional or unconditional • Jumps at the end of a sequence step • Vectored (1 of 16 destinations) Sync Pulse Outputs • Outputs per Sequencer: 2 • Modes:...

Astronics Test Systems Characteristics (continued) • 0° C to +10° C: Not controlled • +10° C to +30° C: 5 to 95 ±5% I/O Channel Auxiliary I/O Channels (per I/O board) • LVTTL (6): Bi-directional • LVDS (2): Differential || 100 Q • LVTTL (2): 15 kQ pull-up to 3.3 V and pull-down to GND Data Rate (max) • 50 MHz (input and output) Interface Front Panel I/O Digital I/O • 200 pin SEAF (Samtec) • 50 pin LBUS (Samtec) PXI Interface Backplane Operation • CLK10 and CLK100: Clock reference • PXI Trigger Lines: Sequence triggers Software Driver Support • 2 Level: 1 @ card VXIpnp type driver; 1 @...