1260-14 - 2 Pages

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1260-14

Catalog excerpts

EADS North America Test and Services Racal Instruments™ 1260-14/14C Digital I/O Module The Racal Instruments™ 1260-14 provides 96 TTL, CMOS, or Open-collector channels in twelve groups of eight bits each. With the open collector version each independent group can utilize a separate internal or external pull-up supply up to 32 VDC. These open collector transistors are ideal for controlling external digital circuitry, switches, relays and similar devices. Each channel is configurable as an input or an output. Channels are individually controlled in asynchronous mode or with other channels in synchronous mode. Key Features • 96 TTL, CMOS or open-collector input/output channels • Drives up to 32 V and sinks up to 200 mA per channel • Two-wire programmable hand shaking • Synchronous, asynchronous and mixed operating modes • 200 kHz data rate • Single-slot, C-size, message-based VXIbus module Product Information The 1260-14 has a two-wire handshake mode available for the control of synchronous I/O transactions. Each handshake line can be programmed as either active high or active low providing a flexible interface with user signals. The 1260-14 is programmable in several operating modes and data may be manipulated in either hex, decimal or binary. Memory is available on the 1260 Series Smart Card Module to allow buffered I/O operations. The 1260-14 is also available in TTL or CMOS compatible I/O channels. Each TTL or CMOS I/O channel may be placed in a high impedance, tri-state mode. The 1260-14 is controlled by the Racal Instruments™ Option 01 message-based interface or the Option 01T message-based and register-based interface. All 1260 control features explained on the Option 01 and Option 01T data sheets are available to this module. Note: Module is supplied with one set of mating connectors. Additional connectors can be ordered using the part number shown below. ECO# 2010-EADSTS-12-13-22-MU. Uncontrolled Unclassified Information (“UUI”). This documentation does not contain ITAR-controlled data within the definition of the ITAR and has been reviewed and approved for release to non-US persons. EADS North America Proprietary Copyright © 2011

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Racal Instruments™ 1260-14/14C EADS North America Test and Services Specifications Output Voltage TTL CMOS Open Collector Vout (high) ≥2.4 V @ -15 mA ≥3.8 V @ 6 mA 5 V ≤Voh ≤32 V Vout (low) ≤0.5 V @ 48 mA ≤0.4 V @ 6 mA ≤1.5 @ Iinfo=200 mA Input Voltage TTL CMOS Open Collector Number of Channels • 96 Vin (high) ≥2.0 V ≥3.15 V ≥2.0 V Vin (low) ≤0.8 V ≤0.9 V ≤1.5 V Data Rate • Static to 200 kHz (Asynchronous, Register-Based) • Static to 800 Hz (Synchronous) Vin (max) 5.25 V 5.00 V 32 VDC Note: The EADS North America Test and Services policy is one of continuous development and improvement....

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