Angstrom Advanced Angstrom Advanced Inc. > Angstrom Advanced > Instruments for Thin Film and Semiconductor [email protected] www.angstromadvanced.com Copyright(C) 2007 Angstrom Adv a nced . All Rights Copy Right(C) 2007 Angstrom Advanced. All Rights Rserved. size="-5">

PhE102-VASE is the most powerful and versatile ellipsometer for research on a wide range of materials: dielectrics, polymers, semiconductors, metals, multilayers, etc. It covers the widest spectral range with the highest spectral resolution. This system is controlled by a remote computer located in the system control module. This instrument is affordable, high quality, and used widely in both academia and industry. Accessorial Options Micro Spot Focus Optics Automated Sample Translation Hardware and software for In-situ mounting Sample Heater Liquid/Electrochemical Cells Mapping Nondestructive...

PhE is a very comprehensive program for data acquisition and analysis. It utilizes sophisticated mathematical fitting algorithms for accurate and fast data analysis of both simple and complex structures. Own large tabulated optical constant database (materials library);Push-button procedure for measurement of routine samples;Versatile recipes for data acquisition, data analysis and mapping;Integrate normal dispersion models to describe material optical constants;Automatic backside correction/correlated layers;Include surface and interfacial roughness analysisBuild user-defined models and database...