Catalog excerpts
A1365 Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator FEATURES AND BENEFITS • Proprietary segmented linear temperature compensation (TC) technology provides a typical accuracy of 1% over the full operating temperature range • 120 kHz nominal bandwidth achieved via proprietary packaging and chopper stabilization techniques • Over Field Fault signal with 6-bit programmable trigger levels, 2-bit programmable hysteresis, and latching or non-latching behavior • Over Field Fault response time < 4.5 μs (typ) • Extremely low noise and high resolution achieved via proprietary Hall element and low-noise amplifier circuits • Customer-programmable, high-resolution offset and sensitivity trim • Available in a 1-mm-thick SIP through-hole package • Factory-programmed sensitivity and quiescent output voltage TC with extremely stable temperature performance Continued on the next page… The A1365 linear output Hall-effect sensor IC is specifically designed to provide a highly accurate output with improved resolution at high bandwidth for use in current-sensing applications. This device employs a segmented, linearly interpolated temperature compensation technology, which provides greater accuracy in sensitivity and offset voltage trimming and hence virtually zero temperature drift. This improvement greatly reduces the total error of the device across the operating temperature range. The highly programmable Over Field Fault signal (FAULT pin) can be used to detect a high magnetic field condition. Broken ground wire detection, undervoltage lockout for VCC below specification, and user-selectable output voltage clamps are also included, which are important for high reliability in automotive applications. The sensor accuracy and diagnostic capability make it ideally suited for automotive sockets such as HEV inverter and DC-to-DC converter applications. The A1365 Hall-effect sensor IC is extremely sensitive, fast, and temperature-stable. The accuracy and flexibility of this device is enhanced by user programmability, performed via the VCC supply and the output pins, which allows the device to be optimized in the application. This ratiometric Hall-effect sensor IC provides a voltage output that is proportional to the applied magnetic field. The quiescent output voltage is user-adjustable around 50% (bidirectional) of Continued on the next page… Programming Control Temperature Sensor CBYPASS EEPROM and Control Logic Sensitivity Control 6-Bit Programmable Window Comparator VREF(High) Offset Control Internal Pull-Up FAULT Dynamic Offset Cancellation Signal Recovery Functional Block Diagram A1365
Open the catalog to page 1Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator FEATURES AND BENEFITS (CONTINUED) • Selectable sensitivity range between 0.6 and 14 mV/G through use of coarse sensitivity program bits • Ratiometric sensitivity, quiescent voltage output, and clamps enable simple interface with application A-to-D • Output voltage clamps provide short-circuit diagnostic • Open-circuit detection on ground pin (broken wire) • Undervoltage lockout for Vcc below specification • Wide ambient temperature range: -40°C to...
Open the catalog to page 2Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator SPECIFICATIONS Absolute Maximum Ratings Characteristic Forward Supply Voltage Reverse Supply Voltage Forward Output Voltage Reverse Output Voltage Forward Fault Voltage Reverse Fault Voltage Output Source Current Output Sink Current Maximum Number of EEPROM Write Cycles Operating Ambient Temperature Storage Temperature Maximum Junction Temperature THERMAL CHARACTERISTICS: May require derating at maximum conditions; see application information...
Open the catalog to page 3Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator Pinout Diagram and Terminal List Table Terminal List Table Number Function Input Power Supply, use bypass capacitor to connect to ground; also used for programming Output Signal, also used for programming Over Field Fault Detection Flag KT Package Pinout Diagram (Ejector pin mark on opposite side) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.alle
Open the catalog to page 4Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator OPERATING CHARACTERISTICS: valid through the full operating temperature range TA, CBYPASS = 0.1 µF, and VCC = 5 V, unless otherwise specified Characteristic Test Conditions Electrical Characteristics Supply Voltage Supply Current ¯ ¯ L¯ No load on VOUT, ¯ ¯ ¯ ¯ pin in highFA¯ ¯ T U¯ impedance state, connected through a 10 kΩ resistor to VCC Temperature Compensation Power-On Time2 VCC rising and device function enabled VCC falling and device...
Open the catalog to page 5Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator OPERATING CHARACTERISTICS (continued): valid through the full operating temperature range TA, CBYPASS = 0.1 µF, and VCC = 5 V, unless otherwise specified Characteristic Test Conditions VOUT Characteristics (continued) DC Output Resistance Output Load Resistance Sens = 2 mV/G, CL = 1 nF, TA = 25°C; step magnetic field of 400 G Over Field Fault Characteristics Fault Switchpoint Programming Bits FAULT_ THRESH Positive Field Fault Switchpoint Range9 TA...
Open the catalog to page 6Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator OPERATING CHARACTERISTICS (continued): valid through the full operating temperature range, TA, CBYPASS = 0.1 µF, and VCC = 5 V, unless otherwise specified Characteristic Test Conditions Fault Characteristics (continued) Fault Delay Due to Load Capacitance ¯ ¯ L¯ RF(PULLUP) = 10 kΩ from ¯ ¯ ¯ ¯ to VCC FA¯ ¯ T U¯ External Pull-Up Supply Voltage ¯ ¯ L¯ External ¯ ¯ ¯ ¯ Pull-Up Resistor FA¯ ¯ T U¯ ¯ ¯ L¯ Internal ¯ ¯ ¯ ¯ Pull-Up Resistor FA¯ ¯ T U¯...
Open the catalog to page 7All ALLEGRO MICROSYSTEMS catalogs and technical brochures
-
A1340
42 Pages
-
A1324
12 Pages
-
A1318
12 Pages
-
A1308
12 Pages
-
A1304
10 Pages
-
A1367
27 Pages
-
A1366
22 Pages
-
ACS770
29 Pages
-
ACS758
22 Pages
-
ACS761
14 Pages
-
A1301 and A1302
10 Pages
-
ACS709
17 Pages
-
ACS716
22 Pages
-
ACS715
14 Pages
-
ACS714
18 Pages
-
ACS712
15 Pages
-
ACS713
14 Pages
-
ACS756
11 Pages
-
ACS710
23 Pages
-
ACS711
16 Pages
-
A1360, A1361, and A1362
26 Pages
-
ACS759
19 Pages
-
Advances in WLED/RGB LED Drivers
13 Pages
Archived catalogs
-
A6261: Protected LED Array Driver
14 Pages
-
Current Sensors
9 Pages