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environmental stress screening test chamber / high-pressure / aging / environmental PCT-45

environmental stress screening test chamber / high-pressure / aging / environmental PCT-45

environmental stress screening test chamber / high-pressure / aging / environmental PCT-45

Product catalog summary
Overview: The document provides technical specifications and application details for the PCT Environmental Stress Screening Test Chamber, designed to test the moisture capacity of semiconductor packaging under extreme conditions.
Application: The chamber is used to evaluate how moisture infiltrates semiconductor packaging, potentially causing circuit breakage or short circuits due to contamination.
Technical Specifications:
  • Models and Dimensions: Four models are available (PCT-35, PCT-45, PCT-55, PCT-65) with varying internal and external dimensions.
  • Temperature Range: Operates with saturated steam temperatures between 100°C and 135°C, with specific pressure settings for different temperatures.
  • Pressure: Displays both relative and absolute pressure values, with absolute pressure adding 100 Kpa to the gauge reading.
  • Humidity: Maintains 100% RH saturation steam humidity.
  • Steam Pressure: Ranges from 101.3Kpa to 2.0Kg/cm2, with a special standard of 3.0Kg/cm2.
  • Safety Features: Includes water short storage protection, overpressure protection, and automatic/manual water replenishing.
  • Power Requirements: AC 220V(±10%), 1 phase, 3 lines, 50/60HZ.
Additional Features: The chamber includes two layers of stainless steel plates and utilizes natural convection circulation for steam.
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Catalog excerpts

environmental stress screening test chamber / high-pressure / aging / environmental PCT-45-1

Application: PCT Environmental Stress Screening Test Chamber is mainly to test the moisture capacity of semiconductor packaging. The products to be measured are tested under severe temperature, humidity and pressure. Moisture will infiltrate into the packaging body along the interface of colloid or colloid and wire rack. The common fault formula is caused by active metallization. Circuit breakage, or short circuit between package leads due to contamination. Technical Parameters: Company Add.:Building C,JinHui Industrial Park, LiXin town,East City district 523125,DongGuan City,China

 Open the catalog to page 1
environmental stress screening test chamber / high-pressure / aging / environmental PCT-45-2

AI SI Li (CHINA) TEST EQUIPMENT CO., LTD Tel.:0086-769-23164266 Company Add.:Building C,JinHui Industrial Park, LiXin town,East City district 523125,DongGuan City,China

 Open the catalog to page 2

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