Network Analyzer (with bias tees) (with bias tees)

ENA – New Standards in Speed, Accuracy and Versatility Key features ► Wide frequency coverage: 9 kHz to 20 GHz analyzers deliver new standards in speed, accuracy and versatility for RF network analysis. Designed with a wide range of measurement capability to meet multiple network analysis needs, the ENA offers efficiency and flexibility for both manufacturing and R&D applications in industries such as wireless communication, automotive, semiconductor, and medical. ► Low trace noise: < 0.004 dB rms at 70 kHz IFBW ► Wide dynamic range: > 123 dB ► Fast measurement speed: 9 msec for 401 points with...

Flexible Test Port Architecture for a Variety of Applications Select the number of ports, frequency and bias tees to fit your application Number of ports Frequency range Option numbers E5071C-240 with bias tees with bias tees 2-Port with bias tees with bias tees with bias tees with bias tees with bias tees 4-Port with bias tees with bias tees with bias tees

Enhanced Usability Increases Efficiency Providing the latest in modern technology, Agilent ENA network analyzers provide the performance and features needed in R&D and manufacturing for wide range of appli- Class largest LCD with touch screen measurement traces Intuitive user interface hard keys, soft keys, secure environments W.BUPTHV t.l>IMMri Windows® Operating system Dual probe power source Context sensitive embedded help user interface lets you quickly retrieve measurement data.

ENA – New Standards in Speed and Accuracy Agilent’s new generation of network analyzers meets and exceeds what was possible with the 8753 family. Carrying on the family tradition, the ENA delivers new standards in speed, accuracy and versatility for RF network analysis. Wide dynamic range >123 dB dynamic range provides more precise evaluation of high rejection filters. Dynamic range comparison: IFBW = 10Hz Low trace noise <0.004 dBrms at 70 kHz IFBW helps minimize errors when measuring high-quality, low loss devices. Trace noise comparison: IFBW = 1 kHz High stability Fast measurement speed 4...

Enhanced Measurement Capability for a Variety of Applications The Agilent E5071C ENA combines the highest RF performance with powerful analysis capabilities and automated test tools that increase test efficiency and yield. High-performance ECal modules dramatically simplify the calibration process Fixture simulator settings with the setup wizard Impedance value display Built-in VBA programming and customizable user interface Powerful analysis capabilities State-of-art calibration techniques ▼ Fixture simulator for • Mixed-mode S-parameter measurements1 • Embedding and de-embedding • Matching...

Accurate and efficient component With a combination of speed, accuracy, and advanced functionality, the ENA provides powerful general-purpose network analysis. The ENA offers extensive measurement capabilities, analysis features, and post data processing capabilities for effective design characterization. The ENA has real-time fixture simulation capability, which lets you specify components as they are used in actual cir- cuits. Bundled VBA macros and analysis functions enable fast, easy post data processing. Measured data is easily shared with EDA tools, such as Agilent's Advanced Design System...

■ Industry-leading RF performance for the highest throughput and yield Passive components The ENA is ideal for high-volume passive component test. Superior measurement performance contributes the highest throughput increasing your production capability. High repeatability and stability improve test yield. Best-in-class RF performance Increase test throughput and reduce the overall cost of test. ▼ Fast measurement speed ▼ Built-in VBA for easy automation and fast data processing ▼ Pre-defined limit test functions to meet your test requirements ▼ Segment sweep function to optimize stimulus setting...

■ Basic and advanced measurement utilities enable thorough device characterization Amplifiers RF amplifiers are used in a wide variety of industries. Whether characterizing the amplifier peformance for wireless communication systems, medical equipment or automotive use, their characterization is always a significant stage in the design and verification process of complete systems. The ENA features the basic measurement fundamentals for P1dB, PAE or K-factor as well as advanced techniques and built-in functions that simplify the total characterization of your amplifiers. High-power measurement...

measurement capability Frequency converting devices such as mixers are used in many applications. These components require unique measurement techniques because they have different frequencies at the input and output ports. The ENA offers several measurement methods for accurate characterization of these devices. Advanced calibration methods including Agilent patented vector mixer calibration (VMC) provide more accurate measurement results of your devices than conventional calibration methods. Eternal SuuLt Vector Mixer Characterization A.01.10 Calibration mixer/filter Capy"*t (c) 2004-2003 *gtarit...

■ Expand your measurement capability with the ENA multiport solution Multiport devices Today’s devices often have multiple functionality integrated into a single component resulting in multiple RF ports. For multiport network analysis, measurement setup time is usually much longer than the actual testing time. When the ENA is combined with the E5092A configurable multiport test set, they form comprehensive multiport solution. The ENA’s Measurement Wizard Assistant (MWA) software simplifies complicated measurement procedures for multiport characterization. Significantly reduce test setup times...

■ Evaluate performance under actual working conditions EMC components Electro-magnetic compatibility (EMC) is a key specification in broadband wireless communication and automotive electronics, where EMC components play an important role in meeting strict standard requirements. The ENA’s powerful analysis functions help you determine the true performance of your product under the actual working conditions. VBA sample programs Comparison of Ferrite Bead Characteristics with Different DC Bias Current Applied DC-biased measurement setup 1. Evaluate EMC components, 2. Display MaxHOLD trace Broad...