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B1500A Semiconductor Device Analyzer

B1500A Semiconductor Device Analyzer
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B1500A Semiconductor Device Analyzer - 1

Agilent B1500A Semiconductor Device Analyzer A complete device characterization solution covering measurement needs from basic IV and CV to ultra-fast pulsed and transient IV measurement

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B1500A Semiconductor Device Analyzer - 2

Accelerate fundamental current-voltage, capacitance and advanced ultra-fast IV device characterization A single-box solution that covers all of your device characterization needs The B1500A Semiconductor Device Analyzer integrates multiple measurement and analysis capabilities for accurate and quick device characterization into a single instrument. It is the only parameter analyzer with the versatility to provide both a wide range of device characterization capabilities along with uncompromised measurement reliability and repeatability. It supports all aspects of measurement, from...

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B1500A Semiconductor Device Analyzer - 3

Making everyone a device characterization expert EasyEXPERT makes device characterization as easy as 1, 2, 3. The B1500A’s EasyEXPERT software includes over 300 ready-to-use application tests, which allow you to make a measurement in three easy steps. The application test libraries furnished with the B1500A’s EasyEXPERT software can not only help you accelerate the characterization of semiconductor devices, but also electronic materials, active/passive components, and many other types of electronic devices. Examples of some of the available application tests are shown in the table to the...

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B1500A Semiconductor Device Analyzer - 4

EasyEXPERT software’s intuitive GUI facilitates device characterization The B1500A platform includes a 15-inch wide touch screen, embedded Windows 7 OS, built-in HDD and DVD drive, and GPIB, USB and LAN interfaces Rotary knob for tracer test 15 inch wide touch screen USB ports for keyboard, mouse or lash drive I/O use. EasyEXPERT supports multiple test modes to improve test eficiency Classic test mode Application test mode The classic test mode provides function oriented test setup and execution with a similar look and feel as that of the 4155/4156. The application test mode provides...

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B1500A Semiconductor Device Analyzer - 5

Customizable and expandable IV, CV, and ultra-fast IV measurement capabilities meet virtually all testing needs VGA video output port GPIB port B1510A HPSMU B1530A WGFMU B1525A HV-SPGU LAN, USB, external trigger in/out and digital I/O ports Test Coverage B1511B Medium Power Source/Measure Unit (MPSMU) For DC and pulsed IV measurement Supported module B1510A High Power Source/ Measure Unit (HPSMU) • Up to 100 V/0.1 A • Min 10 fA / 0.5 μV resolution • Optional ASU for 0.1 fA and IV/CV switching B1517A High Resolution Source/Measure Unit (HRSMU) • Up to 100 V/0.1 A • Min 1 fA / 0.5 μV...

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B1500A Semiconductor Device Analyzer - 6

Absolute current/voltage measurement conidence B1500A SMUs provide easy and accurate IV measurement A source/monitor unit (SMU) integrates all of the resources necessary for IV measurement into a compact module. These include a current source, a voltage source, a current meter and a voltage meter, along with the ability to switch easily between these resources. The tight integration of these capabilities enables B1500A SMU performance to achieve sub pA current measurement resolution. In addition, SMUs have internal feedback mechanisms that enable them to maintain an accurate and stable...

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B1500A Semiconductor Device Analyzer - 7

Complete range of capacitance measurement solutions Measure C-V, C-f and C-t from 1 kHz to 5 MHz The B1500A supports a multifrequency capacitance measurement unit (MFCMU). The MFCMU can perform all of the capacitance measurements necessary for semiconductor device evaluation, including capacitance vs. voltage (C-V), capacitance vs. frequency (C-f), and capacitance vs. time (C-t). The MFCMU can measure across a wide frequency range (1 kHz to 5 MHz) with minimum 1 mHz resolution. The MFCMU can also provide up to 25 V of DC measurement bias. High frequency CV curve Accurate quasi-static CV...

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B1500A Semiconductor Device Analyzer - 8

Multiple options for advanced pulsed measurement needs 500 µs to 2 s B1542A 10 ns pulsed IV parametric test solution Pulse width • Pulse generation up to ± 40 V high voltage from 10 ns pulse width • Advanced output voltage monitoring capability from 5 µs • Waveform generation with 10 ns programmable resolution • Simultaneous high speed IV measurement capability (200 Msa/s, 5 ns sampling) Add-on solution • Pulsed measurement with pulse widths down to 50 µs • Maximum 30 V/1 A (0.1A DC) MCSMU Plug-in module • Pulsed measurement with pulse widths down to 500 µs • Time sampling measurement from...

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B1500A Semiconductor Device Analyzer - 9

More efficient pulsing improves advanced memory and device characterization HV-SPGU supplies ±40 V output and supports up to 3-level pulsing for non-volatile memory test The high-voltage semiconductor pulse generator unit (HV-SPGU) can output pulses of up to ±40 V (into an open load), mak- ing it ideal for applications such as flash memory evaluation. Moreover, in pulse generator unit (PGU) mode both HV-SPGU channels can force 2-level or 3-level pulses, which supports the testing of complex flash memory cells. These capabilities make the HV-SPGU the best pulse generator for advanced...

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B1500A Semiconductor Device Analyzer - 10

WGFMU module enables ultra-fast pulsed measurements not previously possible with conventional instruments Powerful waveform generator/fast measurement unit (WGFMU) supports advanced ultra-fast pulsed and transient measurement Pulse Generator Addition of a shunt-resistance and oscilloscope are needed. Device Under Test 50 Ω output output Impedance causes a load line effect. Ultra-fast pulsed and transient IV characterization of advanced next generation devices is in many cases essential to fully understand their behavior. Although it is possible to use a collection of equipment (such as a...

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B1500A Semiconductor Device Analyzer - 11

B1500A overcomes advanced device characterization challenges Ultra-fast NBTI/PBT MOSFET threshold voltage (Vth) degradation under high gate bias and high temperature is an area of critical concern for advanced semiconductor reliability. The twin phenomena of negative bias temperature instability (NBTI) and positive bias temperature insta- bility (PBTI) require extremely fast measurement equipment, since the Vth degradation recovers very quickly once stress is removed. In fact, measurement needs to begin within a time range of 1 us to 100 us after removal of the stress to avoid dynamic...

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