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AFM/SPM Accessories

AFM/SPM Accessories
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Agilent Technologies ••• ••• AFM/SPM Accessories For the following Agilent AFM/SPM Systems: Anticipate_Accelerate_Achieve •y.r Agilent Technologies

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Agilent Technologies AFM/SPM INSTRUMENTS 5100 AFM/SPM (N9420S) The Agilent 5100 atomic force microscope is a system that delivers atomic resolution and provides excellent imaging capabilities in an easy-to-upgrade package. The 5100 offers many of the same features as Agilent’s sophisticated 5500 AFM/SPM at an entry-level price. Since user requirements often grow, the 5100 is fully upgradeable to the 5500. The 5100 comes with an Agilent multipurpose scanner, giving you the ability to switch AFM/SPM imaging modes. 5420 AFM/SPM (N9498S) Based on the popular Agilent 5400 AFM/SPM, the 5420...

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5 AFM/LFM Detector and Nose Cone 6 Standard AFM/SPM Nose Cone 6 CS-AFM Nose Cones 7 DLFM Nose Cone 8 Standard Sample Plate 8 MAC Mode Sample Plate 8 Cover Glass Sample Plate 8 Petri Dish Sample Plate 8 Temperature Sample Plates 8 Temperature Sample Plate for 5500ILM 9 Alignment Sample Plate 9 Glass Slide Sample Plate for 6000 ILM 9 Cover Slip Sample Plate for 6000 ILM 9 Petri Dish Sample Plate for 6000 ILM 9 Temperature Sample Plate for 6000 ILM 9 Perfusion Cell Sample Plate for 6000 ILM 9 Incubator Sample Plate for 6000 ILM 10 Environmental Isolation Chamber 10 Noise and Vibration...

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Scanners Agilent offers a broad array of high-precision scanners — with scan ranges from 1 micron to 90 microns. Our utilization of top-down scanning protects electronics and piezo elements from damage caused by liquid or harsh imaging environments. Multipurpose Scanners 90µm Scanner N9521A/B 9µm Scanner N9520A/B 90µm Closed Loop Scanner N9524A/B • ฀gilent’s multipurpose scanners deliver unsurpassed performance, versatility, and ease of use for atomic force microscopy. They are ideal for imaging in uid or air and under controlled temperature and environmental conditions. Our multipurpose...

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Scanners continued AFM/LFM Detector • Designed speciically for use with ฀gilent multipurpose scanners, this detector accurately records the bending of the ฀FM/LFM system’s cantilever so as to render images of a sample’s surface properties with superb resolution and idelity. AFM/LFM Detector and Standard Nose Cone • This detector offers optimized recording capabilities and has been specially engineered for use with our multipurpose scanners. An easy-to-load nose cone that enables the performance of contact mode AFM and lateral force microscopy (LFM), as well as our patented MAC Mode imaging,...

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Nose Cones Agilent scanners’ interchangeable, easy-to-load nose cones make switching imaging modes quick and convenient. They have low chemical reactivity and can be used in a wide range of solvents. Customized nose cones are available upon request. Standard AFM Nose Cone N9533A • ฀gilent’s standard nose cone is used to perform contact mode ฀FM/SPM and LFM, as well as our patented MAC Mode imaging. Designed for compatibility with Agilent multipurpose scanners, it holds the probe at 9° from horizontal. This nose cone is made from PEEK polymer. • This nose cone performs acoustic ฀C mode (฀฀C...

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Nose Cones continued 2-Piece AAC Nose Cone N9543A DLFM Nose Cone N9535A • Our two-piece nose cone is used to perform ฀฀C mode ฀FM/SPM in air. Its clever mechanical design simpliies the process of inserting a cantilever. Not appropriate for in-uid imaging. • These nose cones are used to perform Top M฀C Mode imaging with our multipurpose scanners. A 9° nose cone is offered for Top MAC Mode measurements in air; an 8° nose cone is offered for Top MAC Mode measurements in uid. Both nose cones are made from PEEK polymer. • ฀gilent’s STM nose cones have been designed for use with our multipurpose...

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Sample Plates Agilent offers a selection of sample plates. These versatile plates help optimize imaging results, are simple and convenient to use, and can be cleaned quickly without undue effort. Their unique design affords superior stability and easy sample loading. Standard Sample Plate N9716A MAC Mode Sample Plate N9717A Cover Glass Sample Plate N9718A Petri Dish Sample Plate N9719A Temperature Sample Plates -5 to 40°C N9640A (5100 and 5500 only) MAC -5 to 40°C N9648A (5100 and 5500 only) Ambient to 250°C N9647A MAC ambient to 110°C N9641A Ambient to -30° N9643A (5100 and 5500 only)...

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Sample Plates continued Alignment Sample Plate N9737A Glass Slide Sample Plate N9706A Cover Slip Sample Plate N9708A Petri Dish Sample Plates 35mm N9705A 50mm N9705B Temperature Sample Plates Ambient to 80°C N9660A • The alignment plate allows users to set scanner height before setting up their liquid cell experiment to ease the approach, and ensure that the experiment is started safely. Can also be used as a microscope slide sample plate. 6000 • The slide sample plates holds industry standard 1 x 3” glass microscope slides for economical, eficient sample preparation and cleanup. 6000 • The...

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Environmental Options Environmental Isolation Chamber N9441A Noise and Vibration Isolation Chamber N9445A Acoustic and Vibration Isolation Chamber • ฀gilent’s environmental isolation chamber (EIC) has been speciically designed to meet the numerous requirements of intricate, demanding AFM/SPM research. The glass EIC mounts directly to our atomic force microscopes and provides a sealed sample compartment that is completely isolated from the rest of the system. Eight inlet/outlet ports permit the ow of many different gases into or out of the sample area. Agilent scanners reside outside the...

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Environmental Options continued Glove Box N9446A Temperature Controllers 0.1K accuracy N9654A Temperature Sample Plate Connection Kit N9657A • Our miniature glove box can be attached directly to the atomic force microscope body, offering greater environmental control. This clear acrylic box has a stainless steel adapter ring and eight threaded ports for gas inlet/outlet. Air- or moisture-sensitive samples can be precisely loaded on the microscope without ever exposing them to the external atmosphere; the antechamber allows the introduction of samples into the inert environment. Since the...

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