SpeckleCam (ESPI) Data Sheet

Product catalog summary

Introduction
The PhaseCam ESPI by 4D Technology is a dynamic interferometry system designed for measuring diffuse objects using Electronic Speckle Pattern Interferometry (ESPI). It features a compact design with a single camera pixelated sensor, eliminating alignment and calibration issues common in multi-camera setups.

Key Features

Simultaneous acquisition of four phase-shifted interferograms.
High spatial sampling with 1K x 1K or optional 2K x 2K data arrays.
Fast phase acquisition at 30 millionths of a second, enabling operations up to 10,000 times faster than conventional systems.
Vibration insensitive, allowing for accurate optical testing on production floors without costly isolation hardware.
Reduced sensitivity to air turbulence, improving data accuracy and repeatability.

Software Capabilities
The 4SightTM software provides an intuitive interface for setup and data analysis, offering features such as:

Real-time data processing and reference subtraction.
Advanced analysis tools including Zernike and Seidel analyses.
Flexible data export and graphical display options.

Specifications

Optical Configuration: Selectable Mono-static or Bi-Static illumination.
Laser: Pulsed solid-state laser at 532nm, with a minimum pulse energy of 275mJ.
Detector: Single camera with a pixelated sensor, supporting up to 2K x 2K data arrays.
Acquisition Rate: Minimum exposure time of 30 µsec, with a display rate of over 25 frames per second.
Computer System: Minimum configuration includes a Pentium IV processor, 3 GHz, 1 GB RAM, and Windows XP OS.

Performance and Options

RMS Repeatability: Less than 0.001 wave for specular samples and less than 5 nm for differential diffuse samples.
Configuration Options: Includes a 4 MegaPixel camera and various laser power/wavelength options.

Additional Information
The system includes on-site installation and operator training, with free software upgrades during the warranty period. Specifications are subject to change without notice.

Catalog excerpts

Description: Turn-key vibration insensitive E lectronic S peckle P attern I nterferometry (ESPI) system Function Strain measurement of diffuse objectsOptical Configuration Selectable Mono-static or Bi-Static illumination6x Zoom detection imagingAcquisition Mode Simultaneous Phase Shift of speckle interferogramsLaser Pulsed solid state laser @ 532nm, water cooled275mJ/pulse (min), 10nsec pulse length, >1Hz rep ratePolarization Linear, horizontalPupil focus range TBDDetector Single camera, pixelatedsensor, 1K x 1K pixel data array(2K x 2K optional sensor upgrade)Acquisition rate 30 sec minimum...

Open the catalog to page 2

Archived catalogs

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.

Brand list