Projects in Interferometry
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282 E d u c a t i o n a l K i t s Phone: 1-800-775-5273 • Fax: 1-650-964-3584 Application Kits Educational Kits OEK-STD Kit Contents Model (Metric) Description Qty 05BR08 Right Angle Prism, 0.5 in. 1 10B10BS.1 1-inch Round Broadband Beamsplitter 1 10D20ER.1 1 in. Mirror, Broadband 4 14828-01 (16636-01) Rod Wrench 1 16291-01 Project Workbook 1 16449-01 Storage Case with Foam Inserts 1 16569-01 Box, Utility 1 16571-01 Glass Slide 1 16578-01 Target Set 1 16579-01 Polarizer Set 1 16580-01 Waveplate Set, Plastic 1 340-RC (M-340-RC) Rod Clamp 1 4062 Ball Driver, Long Shaft, 3/16 in. 1 41 (M-41) Short Rod 1 ULM Laser Mount 1 910PH-25 Pinhole, High Power 1 Model (Metric) Description Qty AC-1A Adjustable Lens Mount 3 B-2SA Base Plate 3 BUP-2 Universal Base 5 CA-2 Adjustable-Angle Post Clamp, for 0.5 in. (12.7 mm) posts 1 COR-1 Center of Rotation Adaptor (for P100-P) 2 FC-1 (M-FC-1) Filter Clamp, 1/4-20 (M6) 2 SG-22-2 (M-SG-22-2) Breadboard, 2 ft x 2 ft 1 LKIT-2 Introductory Lens Kit 1 P100-P (M-P100-P) Kinematic Mount 4 UPA1 1 in. (25.4 mm) Mirror Holder 4 RSP-1T Rotation Stage, 1 inch (25.4mm) Aperture 1 RSA-1TI Solid Insert for RSP-1T 1 SK-25A (M-SK-M6A) Screw Kit, 1/4-20 1 SP-3 (M-SP-3) 3 in. Post 8 R-31005 Laser, HeNe 1.5 mW Random Polarization 1 VPH-2 (M-VPH-2) 2 in. Post Holder 8 A detailed component list is also available for individual projects. Projects in Interferometry Projects in Interferometry is an educational kit that allows students, educators, and engineers to learn about interferometry and its typical applications. Everything is included in one package, making Projects in Interferometry a great way to add interferometry capabilities or start a new lab without excessive hassle or expense. Experiments in wavelength measurement, wavelength distortion, white light interferometry, and index of refraction can be set up in multiple configurations, offering a wide range of experimental techniques demonstrating alternate interferometer setups. Highly accurate measurements can be obtained using the kit’s high-quality ë/10 optics and precision components. A large, 2 in. beam diameter makes measuring and interpreting useful results easier. Modular English or metric components make upgrading simple and cost effective. The kit’s precision components are compatible with a wide variety of Newport optical elements and accessories, allowing you to easily add capabilities at any time for advanced research or educational topics. Each kit contains a complete set of equipment together with an extensive workbook which includes a tutorial covering basic concepts. Detailed experiment sections include: schematics explaining each experimental setup, demonstration instructions, expected results, and a thorough explanation of the optical principles involved. Each project is self-contained, allowing the student to start with any experiment. Use the full system kit for your educational course on interferometry or select projects that fit your program needs. • More than twenty hands-on experiments in eight projects • Includes everything needed to explore the complete range of interferometry applications • Detailed, step-by-step applications workbook includes complete breakdown of parts used per project • Modular, upgradeable design compatible with Newport components and optics for cost effective expansion • High-quality, 50.8 mm diameter optics — larger beam size simplifies measurement and interpretation of fringe patterns

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Projects in Interferometry - 2

E d u c a t i o n a l K i t s 283 Email: sales@spectra-physics.com • Web: spectra-physics.com Application Kits Educational Kits Ordering Information Model Description OEK-100 Interferometry Kit, 115 V M-OEK-103 Interferometry Kit, 220 V OEK-111 Project Workbook Projects Project Name Features 1 Cyclical Shearing Interferometer Collimation testing and measurement of the radius of curvature of the wavefront. 2 Testing of Optical Components Measure optical figure of merit, distortion and wavefront quality of optical components. 3 Index of Refraction Measurements Measure index of refraction of...

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