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InGaAs line scan camera C15333-10E

InGaAs line scan camera C15333-10E
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InGaAs line scan camera C15333-10E See beneath the surface with InGaAs cameras Si wafer pattern inspection (Left: SWIR image, Right: Visible image) Liquid level inspection of packaged smoothie (Left: Visible image, Right: SWIR image) Suitable for in-line non-destructive inspection SWIR (short wavelength infrared) imaging is a great solution for non-destructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality. Example applications include checking liquid volumes in packages, inspecting contents of sealed containers, and detecting damages and contaminants in agricultural products. In addition, applications in the semiconductor industry include Si wafer pattern inspection and solar cell defect detection. Integrating SWIR imaging into production lines requires cameras such as the C15333-10E InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection. Food and agricultural products SWIR sensitivity from 950 nm to 1700 nm (damage inspection, quality screening, material discrimination etc.) 1024 pixel linear array Maximum line rate: 40 kHz (Si wafer pattern inspection, solar cell inspection by EL/PL etc.) Industry (moisture content, leak detection, container inspection etc.) Interface: Employs Gigabit Ethernet Equipped with high quality images (Back ground subtraction,Real time shading correction)

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Imaging examples Contaminant detection Stones that are difficult to detect in visible images because of their similar size and hue can be easily detected in SWIR images. Sample: Coffee beans Contaminant: Stones Visible image SWIR image Wavelength: 1200 nm Illumination: Reflection Damage inspection It is possible to detect damages on apples that are difficult to distinguish visually. Sample: Apple Visible image SWIR image Wavelength: 1450 nm Illumination: Reflection of InGaAs line scan camera C15333-10E High sensitivity in SWIR High quality images This camera covers wavelengths from 950 nm...

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Semiconductor wafer pattern inspection The internal pattern of Si wafers can be observed. Visible image SWIR image Wavelength: 1100 nm Illumination: Transmission Container inspection The contents of packaged plastic containers, such as instant food, can be checked. Sample: Instant noodles Visible image Employs Gigabit Ethernet interfaces This camera employs Gigabit Ethernet interfaces, supports GigE Vision. Compact design Wavelength: 1200 nm Illumination: Reflection Its compact and lightweight design makes the camera easy to integrate into inspection systems. Size: 49 mm (W) × 49 mm (H) ×...

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Dimensional outlines Specifications Type number Imaging device InGaAs line sensor Effective number of pixels Pixel size Effective area Maximum line rate Internal mode: 40 kHz (21 μs exposure time) Sync readout: 40 kHz Digital output Exposure time External trigger input mode Trigger input connector Sync readout 12 pin SMA or HIROSE connector Gigabit Ethernet Image processing Background subtraction Real time shading correction Lens mount Power supply Power consumption Ambient operating temperature Ambient operating humidity Ambient storage temperature Ambient storage humidity System...

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