DeviceNet

™

eic

icei

B DN I - T - T VC-- B DN - Meets or exceeds ODspecifications for highest system reliability

eciicti -N

TIN , C MTILS PC OT CT, PC / NLONSIN INN INSLTION PO P FOM INN INSLTION DTCONSTCTION TO SILDD PIS IT DIN I TN PIS I STNDDTINND COPPSILDINLMINM OTSID/POLST TP OLPDC SISTNC . OMS/FT M CM MP COLO COD D/LC

ACETITE ALMYSIELDED LAC ALMY SIELDLE

D I STNDDTINND COPPSILDINLMINM OTSID/POLST TP OLPDC SISTNC . OMS/FT M CCPCITNC PF/FT COLO CODIT/LLL TP CL, L FLM SISTNCCSCS M I/II ND / FT

DAIN IE AID SIELD

PAT NMEDESCIPTION

DNA-M

TIC CALE STANDAD METES

DNA-T

TIC CALE STANDAD METES

8

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