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■ FEATURES
- Ambient température opération
- Nu bias required
- Short response lime
- No flicker noise
- Opération from DC to VHF
- Pcrfect match to fast electronies
- Wide dynamic range
- Large area devices
- I.ow eOSI
- C'ustom design upon request
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■ DESCRIPTION
The PVM-n (where n is wavelength l^, in micrometers, to which ihe
detector is oplimizedi séries phoUKleteelors aie multiple lielerojunelion photovolrak' IK delectin's. 'l'hese déviées especialK usel'ul as large a detectors operating witliin S to 12 nui ranue. Higli performance e stability werc achieved by using a variable gap (llg.v'd.Zn)Te semiconduclors. optimized doping and improved surface procès si ng. Custom devices with quadrant cells. multieiement arrays, varie immersion lenses. Windows ami oplieal 11 11 ers are available on request. Standard detectors are available in modified TO-39 or BNC-ba! packaues h siii ih> ttuidow-'-.. OlhtT paekayes. Windows and ci available iipnii request. See appiieai;on notes for more i"
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DetectivFty*: at ABMk at Aop
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HEADQUARTERS SALES OFFICE
3 Swietlikow St., Ha Wyki St.,
01-389 Warsaw, POLAND 01-318 Warsaw, POLAND
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._ . +48 22 666 01 45 tel.: +48 22 666 1'
SYSTEM^ S.A. fax: +48 22 666 01 59 Fax: +48 22 665 21 55
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