Catalogues - wound-chip-inductors

Catalogue WOUND CHIP INDUCTORS

www.taiyo-yuden.com

Page

/ 14

Where to buy
this product ?

Request
a Quote

/ 14

See other catalogues for Taiyo Yuden Europe

Text version of the page

5/5

RELIABILITY DATA

Specified Value

LB3218 LB2518 LB2U16 LB2U12 LB16U8 LBMF16U8

CBC3225 CBC2518 CBC2016 CBC2012

Item

Test Methods and Remarks

LBC2518 LBC2016 LBC2012

CB2518 CB2016 CB2012

LBR2518 LBR2012

LEM2520

CBL2012

CBMF1608

LBM2016

23.LOW temperature life test

nductance change Within±10% Q-

R12~4R7 :

30min.

5R6~330

25min.

390~820

20min.

101:15min.

Inductance change :Within±10%

No significant abnormality in appearance.

LEM • LB • LBG • LBR • CB • CBG • CBL • LBM • LBMF-CBMF Temperature :—40±21C Duration : 1000 hrs

Recovery : At least 2 hrs of recovery under the standard condition after the test, followed by the measurement within 48 hrs.

24.Standard condition

Standard test condition : Unless otherwise specified,temperature Is 20±1513, and 65±20% of relative humidity.When there are question concerning measurement result : In order to provide correlation date, the test shall be condition of 20±213 of temperature. 65±5% relative humidity.

Inductance is In accordance with our measured value.

179

TAIYOYUDEN 200S