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| DFT MAX | |||||||||||||||
| Figure 5: Adaptive Scan fully supports proven TetraMAX ATE links for an effective and accurate yield diagnosis solution. | |||||||||||||||
| Transparent Integration With TetraMAX Power-Aware ATPG DFT MAX transfers all information about the Adaptive Scan architecture to TetraMAX to automatically generate compressed, power-aware test patterns with highest test coverage. Adaptive Scan supports all existing TetraMAX ATPG algorithms and DSMTest fault models. | Integration With TetraMAX Diagnostics Adaptive Scan fully supports proven TetraMAX ATE links for failure diagnosis and delivers a straightforward flow from tester fail to location of the defect. DFT MAX and TetraMAX Diagnostics together deliver a very effective and accurate yield diagnosis solution (Figure 5). For more information about DFT MAX, visit: www.synopsys.com/products/solutions/galaxy/test/ | ||||||||||||||
| synopsys Predictable Success | |||||||||||||||
| Synopsys, Inc. 700 East Middlefield Road Mountain View, CA 94043 www.synopsys.com | |||||||||||||||
| ©2007 Synopsys, Inc. Synopsys, the Synopsys logo, Design Compiler and TetraMAX are registered trademarks. All other products or service names mentioned herein are trademarks of their respective holders and should be treated as such. Printed in the U.S.A. 08/07.VR.WO 07-15756 | |||||||||||||||