X-ray diffractometer (XRD) IPDS II - STOE - #1

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X-ray diffractometer (XRD) IPDS II - STOE
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X-ray diffractometer (XRD) IPDS II - STOE
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X-ray diffractometer (XRD) IPDS II - STOE


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YOUR PARTNER IN X-RAY DIFFRACTION
stoe ipds ii
New Dimensions in Imaging Plate Technology
STOE's completely new designed IPDS II com­bines years of experience with imaging plate diffraction systems and the advances in state-of-the-art computer technology and engineering. It guarantees the well known data quality and accuracy, the long-term stability and reliability of all STOE instruments. The two-circle goniometer, the 340 mm imaging plate, the video CCD camera and the optimized high-speed read-out section are covered by a light-shielding X-ray protection hood.
Equipped with a planar graphite monochroma-tor and an optional X-ray fibre optic high intensity is provided. Other intensity enhancing primary optics can be installed. Whether sealed tube or rotating anode, the IPDS II can be adapted to any kind of X-ray source providing Mo, Cu or Ag radiation. Realignment is straight­forward.
The hardware design offers high sensitivity, low intrinsic noise and an unsurpassed dynamic range > 1:105. The large imaging plate with an active scan diameter of 340 mm gives access to a maximum 2e of 77°.
The IPDS II guarantees efficient collection of highly redundant data sets with an excellent completeness.
The combination of the two-circle goniometer with a video CCD camera and the FaceitVide° software allows precise determination of crystal size and shape as well as semi-automated face-indexing, leading to an excellent numeri­cal absorption correction.
With STOE's IPDS II superstructures are detected easily and accurately, in many cases structure solutions of grown-together or twinned crystals are straightforward.
Powder samples can also be measured and the resulting Debye-Scherrer rings can be converted into powder diagramms.
The sensitive and precise detection of reflections together with a comprehensive and powerful software package supports the experienced crystallographer as well as the newcomer in performing measurements of outstanding quality.

pageCatalog pdf di En 2012-06-22-01