LCR Meters - Stanford Research Systems - #3

/ 5


catalogue search
P. 01
P. 02
P. 03
P. 04
P. 05
Pages:


See other catalogues for Stanford Research Systems
You may also be interested in

Scale, Counter, Amplifier, Optical chopper, Measuring device


Text version of the page

SR715 and SR720 Specifications

Measurement modesAuto, R+Q, L+Q, C+D, C+REquivalent circuitSeries or parallel Parameters displayedValue, Deviation, % Deviation or Bin Number (Deviation and % Deviation are calculated relative to a stored value.)Basic accuracySR715: 0.2 %, SR720: 0.05 % (see graphs on next page for details) Fixture Fixture4-wire kelvin fixture for radial leaded parts with adapters for axial leaded parts.Fixture protectionProtected up to 1 Joule of stored energy and 200 VDC (for charged capacitors). Fused at 0.25 Aoutput current for biased measurement. Measurement Range Calibration (R+Q mode)R0.0001 Ω to 2000 M Ω ZeroingOpen and short circuit compensationCompensation limitsShort: R 10 k Ω µ H to 99999 HQ0.00001 to 50(C+D mode)C0.0001 pF to 99999 General µ FD0.00001 to 10(C+R mode)C0.0001 pF to 99999 Store and recallStore/recall up to nine complete instrument setups. RS-232 Standard interface. All instrument functions can be controlled or read over the interface. GPIB and HandlerOptional IEEE-488.2 and Handler interface. Handler interface uses a DB25 connector, positive logic for binning and control.Operating temperature0 °C to 35 °C Relative humidity<85 % Power20 W, 100/120/220/240 VAC, 50 or 60 HzDimensions13.5 µ FR0.00001 " × 4 " × 14 " (WHD)Weight10 lbs.WarrantyOne year parts and labor on defects in materials and workmanship Ω to 99999 k Ω Electrical Test frequencyFixed frequencies at 100 Hz, 120 Hz, 1 kHz, 10 kHz (SR715 and SR720), 100 kHz (SR720 only)Frequency accuracy±100 ppm Drive voltagePreset levels: 0.10, 0.25, 1.0 VrmsVernier: 0.1 to 1.0 Vrms with 50 mVresolutionDrive level accuracy ±2 % Bias voltageInternal: 2.0 VDC ± 2 %External: 0 to +40 VDC, fused at 250 mA Features Averaging2 to 10 measurementsMeasurement rateSlow, Medium, Fast: 2, 10 or 20 measurements per second at test frequencies of 1 kHz and above,and about 0.6, 2, 4 or 6 measurements per second at 100 Hz and 120 HzRangingAuto or Manual TriggeringContinuous, manual or remoteoverRS-232, GPIB or Handler interfaceBinningUp to 8 pass bins, QDR and generalfail bins, defined from the front panel or over the computer interfaces. Binning setup may be stored in non-volatile memory.

Ordering Information

SR71510 kHz LCR meter w/ RS-232$995Option 01GPIB and parts handler interface$495SR720100 kHz LCR meter w/ RS-232, $1495GPIB and parts handler interfaceSR726Kelvin clips$300 SR727Surface mount tweezers$300 SR7284-wire BNC adapter$200

Stanford Research Systemsphone: (408)744-9040 www .thinkSRS.com


pageCatalog pdf di En 2012-02-07-15