FFT Spectrum Analyzers - Stanford Research Systems - #5

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SR760 and SR770 Specifications

" DOS compatible format, 1.44 Mbyte (720 kbyte for the SR760) capacity. Stores data and instrument configurations. Power60 W, 100/120/220/240 VAC, 50/60 HzDimensions17 White Noise Source HardcopyScreen dumps and table and setting listings to dot matrix and LaserJet compatible printers. Data plots to HP-GLcompatible plotters (RS-232 or IEEE-488.2).Disk3.5 Frequency rangeDC to 100 kHz (all spans)Flatness<1.0 dBpp (rms averaged spectra) Frequency rangeDC to 100 kHz (all spans)Flatness<4.0 dBpp (using 1/3 oct. analysis) " × 6.25 " × 18.5 " (WHD) Weight36 lbs.WarrantyOne year parts and labor on defects in materials and workmanship OutputEqual amplitude sine waves at each frequency bin of the current spanFlatness<0.05 dBpp (typ.) <0.2 dBpp (max.)PhaseAutoPhase function calibrates to current phase spectrum. Pink Noise Source Chirp Source General MonitorMonochrome CRT, 640H by 480Vresolution, adjustable brightness and positionInterfacesIEEE-488.2, RS-232 and Printer interfaces standard. An XT keyboard input is provided for additional flexibility.

Ordering Information

SR760FFTspectrum analyzer$4950 SR770FFTspectrum analyzer w/source$6500 O760HCarrying handle$100 O760RMRack mount kit$85 CT100SRS instrument cart$850 SR760 and SR770 rear panel

Stanford Research Systemsphone: (408)744-9040 www .thinkSRS.com


pageCatalog pdf di En 2012-02-07-16