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SR760 and SR770 SpecificationsFrequency External TTLRequires TTLlevel (low <0.7 V, high >2 V)Post-triggerMeasurement record is delayed by 1 to 65,000 samples (1/512 to 127 time records) after the trigger. Delay resolution is 1 sample (1/512 of a record). Pre-triggerMeasurement record starts up to 51.953 ms prior to the trigger. Delay resolution is 3.9062 ms.Phase indeterminacy<2° Measurement range476 µ Hz to 100 kHz Spans191 mHz to 100 kHz (in a binary sequence)Center frequencyAnywhere within the 0 to 100 kHz measurement rangeAccuracy25 ppm from 20 °C to 40 °C ResolutionSpan/400 Window functionsBlackman-Harris, Hanning, Flat-Top and UniformReal-time bandwidth100 kHz Display Functions DisplayReal, imaginary, magnitude or phase MeasurementsSpectrum, power spectral density, time record and 1/3 octaveAnalysisBand, sideband, total harmonic distortion and trace mathGraphic expand Display expand up to Signal Input Number of channels1InputSingle-ended or differentialInput impedance1 M × 50 about any pointHarmonic markerDisplays up to 400 harmonics Data tablesLists Yvalues of up to 200 points Limit tablesDetects data exceeding up to 100 user-defined upper and lower limit trace segments. Ω , 15 pFCouplingAC or DCCMRR (at 1 kHz)90 dB (input range 100 mVp),0.1 mVp (output <100 mVp)DC offset<10.0 mV(typ.)Output impedance<5 ≥ 14 dBV) NoiseTypical5 nVrms/ √ Hz at 1 kHz ( Frequency rangeDC to 100 kHzResolution15.26 mHz Amplitude accuracy±1 % (0.09 dB) of setting Spectral purity(Harmonics and sub-harmonics) − 80 dBc, f <10 kHz Ω , 50 mApeak output current − 166 dBVrms/ √ Hz) Maximum10 nVrms/ − 70 dBc, f >10 kHz (Spurious)10 kHz) (Spurious)Stanford Research Systemsphone: (408)744-9040 www .thinkSRS.com |
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