Laser Scanners RF620HS(DHS) - RIFTEK - #2

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LASER SCANNERS, RF620HS(DHS) Series Rev. A (14.04.2009) RIFTEK CMOS-array 5. The image of object outline thus formed is analyzed by a signal processor 6, which calculates the distance to the object (Z-coordinate) for each point of the set along the laser line on the object (X-coordinate).
1 6 2 5 4 3 ZX 7 Figure 1. 5. OPERATION MODES AND CONFIGURATION PARAMETERS. 5.1 . Measurement data from scanners can be obtained through serial interface and/or on the ana-log output. 5.2. The nature of operation of the scanner governs its configuration parameters, which can be changed by transmission of commands through serial port. The basic parameters are as follows: Autoexposure and integration time. Level of laser output power. By changing this parameter it is possible to switch the scanner to operation with minimum limiting time of integration (maximum operation speed) for particular sur-faces. The intensity of radiation incident onto CMOS-array de-pends on the surface condition of an object under control and the distance to said object. Therefore, the radiation integration time of the array is automatically adjusted (changed) in order to achieve maximum possible measurement accuracy (autoexposure mode). An alternative operation mode is also possible, where the radiation integration time is constant and is selected manually. It is prefer-able for controlling objects with areas greatly different in reflectivity. Working window. The result update frequency is largely determined by the range of control, which is more significant for Z-coordinate. This parameter allows one to select the working window Page 2/22 , Republic of Belarus
, Minsk, tel./fax: +375-17-281-35-13 -mail: info@riftek.com, http:// www.riftek.com

pageCatalog pdf di En 2012-05-22-31