Catalog excerpts
Renishaw plc New Mills, Wotton-under-Edge, Gloucestershire, GL12 8JR United Kingdom SP80 ultra-high accuracy scanning probe Class leading performance with flexible use of styli The SP80 is a quill-mounted scanning probe that uses digital scale and readhead technology, plus Renishaw’s innovative isolated optical metrology principles, to provide exceptional scanning performance, even with long styli. The digital scale and readheads with 0.02 µm resolution enable exceptional scanning performance with up to 1000 mm long and 500 g mass styli, including star configurations. The SP80 has a kinematic mount that offers a repeatable connection to the mating plate mounted on the quill (KM80), allowing the probe to be removed easily. Unbalanced star configurations do not require counterbalancing and the kinematic stylus changing allows for repeatable relocation of the stylus, optimising stylus arrangements for each feature, and overcoming the need for requalification. Using an isolated optical metrology system that measures the deflection of the whole mechanism, the SP80 provides accurate position sensing without stacked axis errors. Additionally, kinematic stylus holders provide crash protection in the XY plane, and a bump stop prevents damage to the probe in the Z-axis. Key benefits Long stylus carrying capability - with high accuracy The combination of long stylus reach with maintained high accuracy performance makes SP80 the first choice scanning probe for many applications. Rapid stylus interchange Interchange of the stylus holders (SH80) can be automated for optimised productivity by using a rack system and stylus change ports (SCP80) mounted to Renishaw’s modular rack system. Low cost of ownership SP80’s system modularity enables expansion as required. Robust design promotes long working life but should anything go wrong, Renishaw’s rapid service / exchange program minimises downtime. Horizontal mounting option - SP80H A horizontal mounting option is also available. Innovations Isolated optical metrology SP80 directly measures the deflection of the whole mechanism, which provides outstandingly accurate position sensing. The isolated optical metrology system can detect sources of variable error such as thermal and dynamic effects. By contrast, probes with displacement sensors mounted to stacked axes suffer from increased dynamic
Open the catalog to page 1Specifications Probe attributes Ultra-high accuracy scanning probe with 3-axis measurement (±PX, ±PY, ±PZ) * Vertical with SP80, horizontal with SP80H Length (including SH80 stylus holder) 80 mm (3.15 in) square quill to kinematic SP80 quill mount (standard) 60 mm (2.36 in) square quill to 80 mm (3.15 in) square kinematic SP80 probe mount (option) Shank mount and other custom made adaptor plates available - contact your Renishaw supplier for details Quill mounting Measurement range Overtravel range PX* and PY* protected by breakout of the kinematic joint to the SH80 PZ* has a mechanical...
Open the catalog to page 2SP80 performance The plot below illustrates SP80’s remarkable high accuracy scanning performance with increasing stylus lengths. 6.00 6.0 5.50 5.5 Scan speed = 5 mm/s (except on 1000 mm stylus where scan speed = 2 mm/s) Isolated optical metrology Isolated optical metrology can be explained as a feature of the transducer system. The readheads for each axis are fixed to the body of the probe, and measure the deflection in each direction. Any inter-axis movement caused by the arc motion of each pair of parallel-acting springs is directly measured by the sensor system. The squareness and...
Open the catalog to page 3Renishaw plc New Mills, Wotton-under-Edge, Gloucestershire, GL12 8JR United Kingdom In summary SP80 and SP80H are the scanning probes of choice for automotive and power train sectors where high accuracy form measurement with deep reach into components is required. The system’s flexibility and affordability is acknowledged as being significant in terms of user benefits such as: • Ultra-high accuracy measurement, provided by digital scale and readheads • Long styli carrying capability for access to deep features • Isolated optical metrology for direct accurate measurement of stylus deflection...
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