catalogue search
P. 01
P. 02
P. 03
P. 04
P. 05
P. 06
P. 07
P. 08
P. 09
P. 10
P. 11
P. 12
|
|
|
|
|
|
|
|
|
|
|
|
You may also be interested in
FRAM, Processor, Non-volatile memory, Memory, Digital converter
Text version of the page
FM24C256
OL test condition. 1.2 1/31/02 Updated package drawing and dimensions. Rewrote description of the internal memory architecture and endurance section. 1.3 2/3/04 Added “part marking” note to Ordering Information (pg 1). 3.0 2/16/05 Added “green” packaging option. Added ESD and package MSL ratings. Changed storage temperature. New rev. number and 1
st page footer to comply with updated scheme. Changed Data Retention spec. 3.1 5/5/05 Clarified Package Marking Scheme text and drawings. 3.2 5/27/2008 Removed –SE option from ordering information.
Rev. 3.2 May 2008 Page 12 of 12
Serial F-RAM Memory FM24C256 - 33928 Revision History
Revision DateSummary 1.0 4/10/01 Initial Release 1.1 9/28/01 Changed Idd and Isb specifications. Changed test load to 1700 ohms to reflect 3mA VOL test condition. 1.2 1/31/02 Updated package drawing and dimensions. Rewrote description of the internal memory architecture and endurance section. 1.3 2/3/04 Added “part marking” note to Ordering Information (pg 1). 3.0 2/16/05 Added “green” packaging option. Added ESD and package MSL ratings. Changed storage temperature. New rev. number and 1
st page footer to comply with updated scheme. Changed Data Retention spec. 3.1 5/5/05 Clarified Package Marking Scheme text and drawings. 3.2 5/27/2008 Removed –SE option from ordering information.
Rev. 3.2 May 2008 Page 12 of 12