Datasheet TopMap Pro.Surf | 3D surface topography
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Datasheet TopMap Pro.Surf | 3D surface topography - 1

TopMap Pro.Surf TopMap Pro.Surf+ The TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ are high-precision, non-contact measurement systems with a large field of view for fast and efficient surface characterization of precision parts. Incorporating a traceably calibrated white-light interferometer with large vertical measurement range, TopMap Pro.Surf and Pro.Surf+ can precisely characterize surfaces near steep edges such as drilled holes or on parts with large steps. Flatness and parallelism parameters, even for macroscopic samples, can be checked quickly and with excellent repeatability. An additional chromatic-confocal sensor enables roughness evaluation in a single measurement with the TopMap Pro.Surf+. TopMap Pro.Surf TopMap Pro.Surf+ Optical surface metrology for quality control applications Datasheet Quick and precise 3D surface characterization Detect large areal form deviation even without stitching Optical roughness measurement (TopMap Pro.Surf+) Short measurement time and large field-of-view for automation Non-invasive measurements Measures almost any surface Check tolerance values with high reliability and high repeatability Large vertical scan range of 70 mm Measure hard to reach area

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Datasheet TopMap Pro.Surf | 3D surface topography - 2

Technical specifications The information for the models TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ comply with the initiative "Fair Data Sheet" for optical surface measurement devices. General features Positioning volume Max. number of points in single measurement Optical specifications Version small Version large Calculated maximum angle Measurement point spacing Version small Version large Extended measuring range Extended measuring range with data reduction Measuring area Working distance Vertical measuring range Calculated lateral optical resolution Extended measuring range...

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Datasheet TopMap Pro.Surf | 3D surface topography - 3

Other features Measuring principle Scanning white-light interferometry (Michelson) Optical setup Telecentric; light source: long-life LED, 525 nm Other features Manual filter wheel with 3 filters for adapting to different sample reflectivities; Optical tool for automatically identifying the measurement position Data formats Topography formats: SUR, ASCII Export formats: qs-STAT, PDF, BMP, PNG, TIFF, GIF Additional sensor with TopMap Pro.Surf+ Measuring range Measuring principle Working distance Lateral resolution Typical roughness measurement Application-specific features Typical flatness...

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Datasheet TopMap Pro.Surf | 3D surface topography - 4

OM_DS_TopMap_Pro.Surf_E_42405 2023/03 - Technical specifications are subject to change without notice. Shaping the future since 1967 High tech for research and industry. Pioneers. Innovators. Perfectionists. Find your Polytec representative: www.polytec.com/contact Polytec GmbH · Germany Polytec-Platz 1-7 · 76337 Waldbronn

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