Catalogue 2009 PI Fast Steering Mirror Systems, Piezo Mirrors for Laser Steering and Astronomy
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PI
Test & Metrology Protocol for Piezo Systems Getting What You Bargained For
Nanopositioning/Piezoelectrics
Piezo Flexure Stages / High-Speed Scanning Systems
Linear
Vertical & Tip/Tilt 2- and 3-Axis 6-Axis
Fast Steering Mirrors/ Active Optics
Piezo Drivers / Servo Controllers
Single-Channel
Multi-Channel
Modular
Accessories
Piezoelectrics in Positioning
Piezo nanopositioning systems are significant investments and PI believes in optimizing the performance of every cus­tomer's system. PI individually tests every stage and opti­mizes the static and dynamic performance for the cus­tomer's application. The metrology test protocol is part of the system's delivery pack­age. It shows the customer what the performance of the system was at the time of delivery and which system components belong together. For PI every metrology proce­dure and its recording is a quality assurance instrument, and only nanopositioning sys­tems which meet their specifi­cations will leave the premises.
Furthermore, PI makes signifi­cant continuing investments in improved-quality, higher­performance nanometrology equipment so that we can deliver better value to our cus­tomers.
Because a nanomechanism can only be as accurate as the equipment it was tuned and tested with, PI closed-loop stages are measured exclusive­ly with prestigious Zygo inter­ferometers. PI's nanometrology metrology laboratories are seismically, electromagnetical-ly and thermally isolated, with temperatures controlled to bet­ter than 0.25 °C / 24 hrs. We are confident that our metrology capabilities and procedures are the benchmark for the industry.
PI
Performance Test Protocol P-517.6CD - Linearity
MeasuremeniSeiup
Nanometrology
Micropositioning
Index
All PI nanoposition­ing systems come with
extensive system performance docu­mentation
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