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3D confocal microscope for topography - PHASEVIEW


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»urPhaseHS
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3D High-Speed Metrology Device
SurPhase® HS is a fast 3D measurement device based on PhaseView's patented Digital Wavefront Technology® combining video microscopy and 3D surface topography capabilities.
By replacing complex equipment for 3D visualization and measurement, SurPhase® HS is an affordable tool offering unique benefits:
All-in-one device combining video microscopy and 3D Flexible with easy objective change Easy setup & operation
Fast acquisition & processing time, less than 2.5 s Accurate measurements in nanometer range Certified measurement device
2D Video Images
All Surface Types
Corresponding 3D Surface Topography
SurPhase® HS Delivers 3D Micro Topography Roughness • Waviness • Step Heights • Profiles
Medical Devices Electronics Micromechanics Semiconductors Ceramic Paper Polymers Metal
* /Phase ěiěb'jj
The Digital Wavefront Company
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pageCatalog pdf di En 2012-02-07-17