X-MET5100/5000 - Soils brochure - Oxford Instruments Analytical - #1

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Soil X-MET® for soil analysis Fast, on-site soil screening High speed on-site measurement: • Rapid, simple on-site screening • Directly from the ground • In sample bags or cups • Laboratory quality analytical data by measuring prepared samples in bench-top mode • Analyze any sample type, including soil, rock, dirt, humus, sand, powder, liquid etc. Most cost effective testing Accurate heavy element analysis down to ppm levels! At the pull of a trigger, the X-MET5000 and X-MET5100 X-ray fluorescence (XRF) analysers provide fast, highly accurate, on-the-spot sample screening and analysis. The need for expensive laboratory testing is minimal. X-MET enables GPS integration for real-time correlation of measurement data and location coordinates. • Accurate and reliable identification of heavy element pollutants • Define the extremities of ‘hotspots’ in seconds • Easy data transfer to PC assures maximum efficiency and minimum errors when working on-site • Pre-sort contaminated soil to minimize remediation costs • Soil remediation decisions made instantly • Fast and reliable Go/No-Go decisions, and fully configurable Pass/Fail alarms Top of the range X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and significant accuracy improvement over conventional systems. Isn’t it time you used X-MET to improve your productivity and screening confidence? Silicon Drift Detector technology improves productivity!