X-MET5100/5000 - Mining brochure - Oxford Instruments Analytical - #1

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mining X-MET® for mining Fast, on-site ore analysis! At the pull of a trigger, Oxford Instruments’ hand-held X-MET5000 and X-MET5100 X-ray fluorescence (XRF) analyzers deliver fast, highly accurate on-site sample screening and analysis. Both analysers provide real-time data in seconds, for: • Ore exploration • On-site excavation control • Mine mapping • Process monitoring: concentrates, tailings etc. • Environmental control What’s more, X-MET enables precise portable GPS integration for real-time ore exploration and mine mapping. Top of the range X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and significant accuracy improvement over conventional systems. Isn’t it time you used X-MET to improve your productivity and screening confidence? Silicon Drift Detector technology improves productivity! • Highly accurate ore analysis from Al to U • Reliable Al, Si, P, S analysis without vacuum or helium attachments • Measure directly on drill core sample • Certified IP54 NEMA 3 splash and dust proof • Results obtained in seconds Highly accurate and repeatable sample analysis • Optional easy-to-use software for unbeatable accuracy • Universal Fundamental Parameter analysis mode for measurement of ores without known standards • Go/No-Go user configurable result format • User interface in >10 languages • Rapid data transfer to PC Minimal need for expensive and time consuming laboratory analysis Rapid single shot mine mapping!