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Oxford Instruments NanoAnalysis
UK
Halifax Road, High Wycombe
Bucks, HP12 3SE England
Tel: +44 (0) 1494 442255
Fax: +44 (0) 1494 524129
Email: nanoanalysis@oxinst.co.uk
China
Shanghai
Tel: +86 21 6360 8530/1/2/3 Fax: +86 21 6360 8535 Email: na.sales@oichina.cn
France
Saclay, Cedex
Tel: +33 (0) 1 69 85 25 24 Fax: +33 (0) 1 69 41 86 80
Email: analytical-info@oxford-instruments.fr
Germany
Wiesbaden Tel: +49 6122 937 176 Fax: +49 6122 937 175 Email: nanoanalysis@oxford.de
Japan
Tokyo
Tel: +81 (0) 3 5245 3591 Fax: +81 (0) 3 5245 4466/4477
Email: nanoanalysis@oxinst.co.jp
Latin America
Concord, MA, USA
Tel: +1 978 369-9933 Fax +1 978 369 6616
Email: nanoanalysis@ma.oxinst.com Singapore
Tel: +65 6337 6848 Fax: +65 6337 6286
Email: nanoanalysis@oxford-instruments.com.sg
USA - Oxford Instruments
Concord, MA, USA Tel: +1 978 369-9933 Fax +1 978 369 6616
Email: nanoanalysis@ma.oxinst.com
INCA
One fully integrated platform that provides many solutions for microanalysis in the electron microscopy
INCAEnergy
25 reasons to choose this solution for EDS on the SEM
INCASynergy - EDS + EBSD
One product, twice the performance
easily capture crystallographic and chemical information
from your samples
GSR Analysis
Wavelength Dispersive X-ray Microanalysis
l(Explained) m M
I 1
WDS on the SEM
Combined EDS/WDS
Oxford Instruments, at High Wycombe, UK, operates Quality Management Systems approved to the requirements of BS EN ISO 9001. This publication is the copyright of Oxford Instruments Analytical Limited and provides outline information only which (unless agreed by the company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. Oxford Instruments' policy is one of continued improvement. The company reserves the right to alter, without notice, the specification, design or conditions of supply of any product or service. Oxford Instruments acknowledges all trade marks and registrations.
© Oxford Instruments Analytical Ltd, 2006. All rights reserved.
Part no: OIA/144/A/0506
PATENTS EP 0325383 EP 0302716 US 4931650 GB 2192091
US 5170229 US 5357110
JP 2557692 JP 2581597
EU 0568351
CERTIFICATE NUMBER FM29142
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