LICS-200A
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GEOMETRICAL ALIGNMENT LASER LICS-200A Optodyne's LICS-200A is a complete system for the measurement of straightness accuracy, squareness accuracy and parallelism. It is specially designed for Machine Tool Calibration and Compensation. A laser beam is used to produce a straight line equivalent to the straightedge and an optical sensor like a dial gauge, is used for determine the vertical and horizontal deviations at the same time . An optical square is used to bend the beam precisely at 90°deg angle for squareness accuracy measurement. LICS-200A is very easy to use and align, and in combination with LICS-100A Compact Laser Interferometre can provide the measurement on linear displacement, straightness, squareness, pitch and yaw angular errors. The system is very compact and fits in one very small carrying case. MAJOR FEATURES AND BENEFITS Straightness and Squareness Laser Calibration System Compact and light-weight Easy to setup and operate Software data collection Software Analysis and Report Windows™ software and USB interface Supports VDI, ISO and ASME B5.54 standards Measures, straightness , squareness and parallelism errors Parallelism measurement MAJOR APPLICATIONS OPTODYNE, INC. 1180 MAHALO PLACE Rancho Dominguez, CA 90220 800/766-3920, 310/635-7481 FAX: 310/635-6301 E-MAIL: sales@optodyne.com WEB www.optodyne.com Measure Straightness and squareness errors in Machine tool Straightness and Squareness error compensation files generation Alignment of linear guide and machine beds. Machine Tools Alignment

Description and Specifications The Laser Head Module houses a HeNe laser source. The visible red light of straight Laser beam is easily delivered on the center of the target adjusting the fine pitch screw of the beam bender. The straightness is determined by the Quad-detector Target, that convert the laser beam position, into vertical and horizontal deviations. The result is sent to the Notebook PC through USB. A Windows software is used to Display the vertical and horizontal deviations and for data collection and analysis. The resolution is 0.1 µm. To measure Squareness the beam is bended...