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| The CL-Series: High-Precision, Reliable, Noncontact Thickness Measurement For over 10 years Ono Sokki's innovative CL-series noncontact thickness meters have provided highly accurate measurement capabilities in a variety of challenging applications. Now, Ono Sokki introduces the latest additions to the CL-series product line: CL-2400: Non-Contact Thickness Meter for conductive and semiconductive materials CL-6200: Non-Contact Thickness Meter for conductive, semiconductive, and insulating materials Based on a unique, capacitive measurement principle CL systems make use of Ono Sokki's proven VE-series high-precision, capacitive gap detectors. Measurements are possible on a wide array of materials, ranging from silicon wafers and steel plates to films and glass plates. When combined with the appropriate sensor, the following measurement ranges are possible: Conductors or Semiconductors: 0.1 urn to 99.9999 mm (0.004 to 999.999 mil) Insulators: 0.1 urn to 5.000 mm (0.004 to 196.851 mil) FEATURES: • The noncontact measurement process does not affect the material under measurement. • Easy to read, large digital display. • A simple sensor structure provides excellent durability & reliability. • Our proprietary operating system ensures high accuracy, stability, and superior resolution. • Configurable for in-line running thickness measurements. • Digital output and printer interface for logging data. • Built-in statistical processing functions (CL-6200) • User-defined calculations (CL-6200) | ||||