Catalogue Nanominiature Strip Connectors
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Tested to and Passed the Following Performance Specifications

Cto +125 C,5cycles Humidity (Mated): IAW MIL-STD-1344, Method 1002.2, Type II, Omit steps 7A & 7B Vibration: IAW-MIL-STD-1344, Method 205.1, Test Condition IV, 20 g’s Mechanical Shock: IAW-MIL-STD-1344, Method 2004.1, Test Condition G, 100 g’s Durability: 500 cycles Contact Resistance after Durability: 25 milliohms (25 mv) max @ 1.0 amps Mating/Unmating after Durability: Forces not to exceed 6 oz/contact Salt Spray: 48 hrs IAW-MIL-STD-1344, Method1001.1, Test Condition B Low Level Contact Resistance after Salt Spray:28 milliohms max (2.8 mv) max @ 100 milliamps Contact Resistance after Salt Spray:28 milliohms (28 mv) max @ 1.0 amps Mating/Unmating force after Salt Spray: Forces not to exceed 6 oz/contact Contact Retention after Salt Spray: Minimum of 2 lbs contact retention Thermal VacuumOutgassing: NASA SP-R-0022 Solder Heat & Contact Retention: 360 Current Rating: 1amp maxDielectric Withstanding Voltage: 350VAC RMS Insulation Resistance: 5000 Megohms min @ 500 VDC Contact Resistance: 25 milliohms (25 mv) max @ 1.0 amps Mating/Unmating Force: Forces not to exceed 7 oz/contact Temperature Cycling: -55 Cfor 10 sec. & contacts must withstand 2lbs retention force Solderability: MIL-STD-202, Method 208
INFORMATION SHOWN IS SUBJECT TO CHANGE WITHOUT NOTICE Page 3-5 7260 Commerce Circle East • Minneapolis, MN 55432-3103 • Ph: (763) 572-0656 • www.omnetics.com
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