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Electron microscope, Scanning tunneling microscope, Auger spectrometer, Microscope, LEED spectrometer
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Four Independent
Scanning Probe
Microscopes
• 4-Point Transport Measurements on Nanostructures
• Electrical Contacting of Nanodevices
• STM-Based Safe & Non-Destructive Tip Approach
• Full STM Capability
• High-Resolution, < 4 nm SEM Imaging for
Rapid Tip Navigation
• High-Resolution, < 10 nm SAM Imaging for
Chemical Mapping
• True UHV Operation for Clean & Artefact-Free Surfaces
UHV NANOPROBE 175-V02/07.06
UHV NANOPROBE
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