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Scanning tunneling microscope, Auger spectrometer, Scanning electron microscope, Photoelectron spectrometer, Electron microscope
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| ^_Nano Technology | ||||||||||
| • ESCA Lateral Resolution 150 nm with Synchrotron Raditation 650 nm Resolution with Al Koc • Survey Images with < 50 nm PEEM Resolution • Aberration Corrected Energy Filter • High Power Monochromatic X-ray Source | ||||||||||
| Small Spot Spectroscopy | ||||||||||