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XPS spectrometer, Photoelectron spectrometer, Scanning tunneling microscope, LEED spectrometer, Scanning probe microscope
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| micron NanoTechnology | |||||||||||||||||||||||||||||||||||||||||||||||||
| Atomic resolution STM on Au(111) at T = 70 K. Scan range 5x5 nm. | Atomic resolution STM on Si(111)-(7x7) at a TRUE tunneling current of 1 pA. Scan range 50x50 nm. | SEM image of ZnO insulating nanocrystals. Excellent SEM image of Au islands on Carbon. Ultimate resolu-resolution at low beam energy, 200 eV. tion below 3 nm at 15 keV. | |||||||||||||||||||||||||||||||||||||||||||||||
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| Line profile showing 2.3 nm resolution. Spot size defined as the 20%-80% width of a step edge. | |||||||||||||||||||||||||||||||||||||||||||||||||
| Pre-amplifier technology: Schematic of the IVC H3 set-up showing two switchable feedback resistors and compensation at the very first operational amplifier stage. | |||||||||||||||||||||||||||||||||||||||||||||||||
| Distance [nm] | |||||||||||||||||||||||||||||||||||||||||||||||||
| Ag clusters on silicon. Corresponding silver (352 eV) SAM image and line profile with sub-10nm resolution. | Ag clusters on silicon. Corresponding silicon (92 eV) SAM image and line profile with sub-10nm resolution. | ||||||||||||||||||||||||||||||||||||||||||||||||
| Your local partner: | |||||||||||||||||||||||||||||||||||||||||||||||||
| Headquarters: Omicron NanoTechnology GmbH Limburger Str. 75 • D-65232 Taunusstein • Germany Tel. +49 (0) 61 28 / 987 - 0 • Fax +49 (0) 61 28 /0 987 - 185 www.omicron-instruments.com or www.omicron.de | |||||||||||||||||||||||||||||||||||||||||||||||||
| MSLAB 103-V05/10.04 | |||||||||||||||||||||||||||||||||||||||||||||||||
| Technical alterations reserved. Specifications and Describtions contained in this brochure are subject to alteration without notice. | |||||||||||||||||||||||||||||||||||||||||||||||||