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Spectrometer, Scanning tunneling microscope, Scanning electron microscope, Auger spectrometer, Scanning probe microscope
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| MULTIPROBE Chamber Modularity | |||||||||||||||
| Analysis | |||||||||||||||
| The analysis chamber houses various spectroscopy techniques, including XPS, ISS, UPS, AES/ SAM, SEM, etc. Alternative analysis chambers for dedicated applications such as Mono-XPS, LT STM, ARUPS, HREELS are also available. | |||||||||||||||
| Microscopy | |||||||||||||||
| This has flanges for excitation sources and sample transfer. The design is straightforward and allows fast sample exchange between the analysis chamber, PEEM and SPM. | |||||||||||||||
| The Scanning Probe Microscope (SPM) is housed in its own chamber bolted directly onto the analysis chamber. This enables easy access and simultaneous operation of other analysis techniques. The chamber has suitable viewports for optimal observation of the tip/sample coarse approach with a CCD camera. The VT SPM bolt-on chamber is also compatible with in-situ evaporation from below. An optional chamber extension can house a Photon Electron Emission Microscope (PEEM) between the analysis and microscopy chambers. | |||||||||||||||
| Wobble Stick | |||||||||||||||