FOCUS PEEM
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FOCUS PEEM Photo Emission Electron Microscope • 20 nm Lateral Resolution • Easy to Operate • Real-Time Imaging • Surface Sensitive Microscopy • Chemical Mapping • Local Spectroscopy • Compatible with MULTIPROBE UHV Systems

The Bolt-On PEEM An Ease of A 1 mm 88 2

Platinum wires, 8 nm thick, 50 nm wide (smallest dimension) on a 20 nm thick Titanium oxide film on 100 nm Silicon oxide. The sample shows an array of 17 wires starting with contact areas of approximately 40 µm which contact a wire line, each wire has a width of 50 nm. A small FoV (field of view) of 9 µm shows that the 50 nm wires and contacting area can be clearly resolved. 1 µm Operation Concept Photoemission Electron Microscopy (PEEM) is an extremely powerful imaging technique, whose versatility for topographical, chemical and magnetic contrast imaging at high resolution has been...

The Modular Concept FOCUS PEEM Features Micro-analyzer Imaging energy filter Imaging detector Time-of-flight energy filter The FOCUS PEEM BA is the basic version of the PEEM instrument series. It is a bolt-on instrument which can be easily integrated in vacuum chambers. It is the heart of all extended PEEM instruments. For high performance PEEM operation a rigid and compatible sample manipulator is required in order to avoid the influence of mechanical vibrations. The FOCUS PEEM features a three-lens, fully electrostatic electron column consisting of a tetrode objective lens - an immersion...

The integral sample stage of the IS-PEEM guarantees ultimate stability for optimal resolution avoiding any possible relative movement of sample and objective by mechanical integration of the sample into the objective. This is of particular importance for applications with long acquisition times, which can be obtained without compromising the resolution. The piezo-electrically driven IS-stage provides precise positioning of the sample within an area of 8 x 8 mm with an accuracy of 100 nm. Position Readout The optional position readout allows the user to navigate on their samples, and...

Time-of-Flight Energy Filter The Time-of-Flight (TOF) imaging energy filter is ideally suited for energy filtered low intensity applications with electrons in the low kinetic energy range. B Together with a time sensitive imaging Delay Line Detector (2D DLD), a dedicated drift tube and a pulsed light source, the TOF PEEM offers a unique detection system. The detector allows true single electron counting with massive parallel detection and excellent signal to noise ratio. In addition to standard energy filtered TOF PEEM experiments the detector also allows for time dependent studies with an...

C tx1 D t0 tx2 A Time of Flight Filter Objective Contrast Lens Aperture 2nd Stigmator Iris Aperture MCP CCD Camera PEEM hν Sample Octopole Stigmator Projection Lenses Screen Drift Tube B PEEM hν FOCUS PEEM with TOF detector. The TOF PEEM consists of an FOCUS IS-PEEM together with a long drift tube and a 2D delay line detector (DLD) placed on a linear retraction mechanism. -8.4 ns -8.4 ns -8.4 ns Operational modes: The TOF PEEM features fast switching from standard (straight through) PEEM Mode to TOF PEEM operation by using a linear retraction mechanism: (A) non filtered Standard PEEM...

Imaging High-Pass Energy Filter The incorporation of energy filtering into the FOCUS PEEM yields improved performance and opens up new application possibilities. The retarding imaging energy filter (IEF) acts as a high pass filter for the full image. Setting the energy filter to a specific electron energy facilitates element specific mapping with increased contrast. The IEF is a dedicated energy filter for all applications with good photoelectron yield. The IEF effectively reduces the chromatic aberration, i.e. the energy spread of the electrons contributing to the formation of the image....

A Objective Lens Contrast Aperture Projection Lenses E = E0 CCD Camera PEEM B Objective Lens Contrast Aperture Projection Lenses E = E0 PEEM Sample hν Octopole Stigmator Entrance Lens MCP Screen Sample hν Octopole Stigmator Entrance Lens MCP CCD Camera Screen E = E0 PEEM E = E0 PEEM hν The Imaging Energy Filter (IEF) is fitted at the exit of the IS PEEM (A). The IEF PEEM features two operational modes: the standard non-filtered PEEM mode and the filter mode (B). The IEF operates as a high pass filter. The potential difference between a micro-grid and the sample is tuned to select the cut...

st re st re PEEM with Micro-Analyser The FOCUS PEEM micro-analyser combines realtime surface microscopy with local chemical analysis using Energy distribution curves of field-emitted electrons of a field emission spot from a ~5 µm area.1) Large area mapping & spectroscopy with micro-analyser: CVD Diamond Film & Field Emission Origin of Field Emission from a Nano-Diamond/Carbon Electron Emitter: Mosaic of 230 PEEM images of a chemical vapor deposition (CVD) diamond film with a field of view of about 55 µm.1) microspot electron spectroscopy (kinetic energy up to 1600 eV) at an energy...

ve ns Analyser Detector Contrast Aperture Projection Lenses Double Micro Grid (E0) Objective Contrast Lens Aperture 2nd Stigmator Iris Aperture MCP CC Ca PEEM hν Octopole Stigmator Entrance Lens MCP Screen Sample hν Octopole Stigmator Projection Lenses Imaging Double-Pass Energy Analyser NanoESCA* features ultimate spectroscopic performance for PEEM imaging in the UPS and XPS regimes. Entrance Lens Slits Screen Au 4f C 1s PEEM 20 µm hν e Contrast s Aperture hν hν The NanoESCA consists of a PEEM and hν an imaging energy analyser. The dediTi 2p O 1s(1) cated aberration compensated imaging...

Bolt-On Concept / System Integration The FOCUS IS-PEEM strictly follows the flexible ‘bolt-on‘ concept - a flange mounted instrument without the need for a dedicated PEEM UHV system. With the integrated sample stage (IS) directly attached to the lens system the FOCUS IS-PEEM allows for uncompromised mechanical stability when attached to a UHV system. It is compatible with Omicron sample transfer and other surface analysis instruments. The modularity of the FOCUS PEEM with the PEEM´s unique contrast mechanisms and high resolution fits perfectly with the wide range of modular Omicron...