Group: NIKON GROUP
Catalog excerpts
K-SCAN MMDx Handheld scanners K-CMM Optical trackers Full freedom scanning in large volumes NIKON METROLOGY I VISION BEYOND PRECISION
Open the catalog to page 1LARGE VOLUME, FULL FREEDOM 3D SCANNING K-Scan MMDx is Nikon Metrology’s walk-around laser scanner for portable metrology applications. Accuracy, ease-of-use and stunning performance ensure it to be the most capable handheld scanning solution without mechanical constraints. The scanner is tracked by the K-CMM Optical Tracker so that operators can measure anywhere needed By combining the accuracy and productivity of the ModelMaker MMDx laser scanner with the user freedom, measurement volume and motion compensation of the K-CMM Optical Tracker system, the K-Scan MMDx becomes an invaluable tool...
Open the catalog to page 2K-CMM ADVANTAGES DYNAMICALLY COMPENSATED MEASUREMENT MULTI-PROBING SOLUTION By positioning LED markers on the measured part, instabilities are compensated so measurement of parts that move or vibrate is possible to the same level of accuracy as if they were rigidly fixtured To measure geometric features, seamlessly switch to the lightweight, highly repeatable Multi-Sided Probe which features a range of motion free from directional limitations Probe configurations can be quickly changed using the integrated Renishaw Autojoint adaptor to enable precise inspection of visually or physically...
Open the catalog to page 3K-Scan MMDx specifications K-Scan MMDx100 K-Scan MMDx200 Accuracy (1o)1,2 C€ Complies with 21 CFR 1040.10 and 1040.11, Laser Notice No. 50 dated June 24, 2007 1 Typical values are 30% better than published values. 2 Laser scanner Accuracy is determined by scanning a plane from various directions, each time using the entire scanner field of view. The result Is the maximum to deviation of the scan data to fitted plane features. Max output = 5 mW & 1.0 mW Emitted wavelength: 660 nm & 635 nm IEC60825-1 edition 2.0 2007-03 CLASS 2 Laser Product Read manual before use K-CMM specifications...
Open the catalog to page 4All Nikon Metrology catalogs and technical brochures
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MCT225 Metrology CT
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Industrial X-ray and CT
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NEXIV VMZ-S
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bw series
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automated ct
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Autocollimator
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Overview brochure
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Microscope components
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CAMIO8
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ALTERA CMM
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CMM-Manager
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Newsmagazine Vol.13
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MCAx-MM
8 Pages
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LC60Dx
4 Pages
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LC15Dx
8 Pages
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NWL200
5 Pages
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Eclipse MA200-MA100N
12 Pages
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Eclipse LV-N Microscopes
9 Pages
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XT V Series
12 Pages
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VMZ-R Series
7 Pages
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MM-Series
15 Pages
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AZ100M-AZ100
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NIS-Elements
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XC65Dx(-LS)
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Digital sight series
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L100 Laser scanner
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Profile Projectors
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Automated CT
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Configurable X-ray CT systems
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Focus
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iNEXIV VMA series
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JEOL Smart Coater
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JCM 6000 Plus Neoscope
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iSpace Assembly Fabrication
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iSpace
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H14L
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eclipse E200pol
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Nikon Metrology News Vol.10
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Nikon Metrology News Vol.9
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LV100N POL Ci POL
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LV-DAF Brochure
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Archived catalogs
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NEXIV VMR Brochure
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Intensilight Brochure
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Eclipse L200 Series
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Eclipse LV Series Brochure
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Neoscope JCM-6000 Brochure
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LC15 Optical Probe
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XC50-LS Cross Scanner
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stereomicroscope SMZ1000
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Neoscope Brochure
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AMI-3000
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COOLSCOPE
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BioStation IM
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BioStation CT
8 Pages
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Neoscope Brochure
4 Pages
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DXM-1200C
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Optistation-3100
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AMI-3000
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Eclipse FN1
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Eclipse E100 Brochure
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Fluorescence Filter Blocks
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Eclipse 50i/55i Accessories
5 Pages
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Laser TIRF System
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Eclipse TS100/TS100F
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Eclipse TE2000 Brochure
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COOLSCOPE
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BioStation IM brochure
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BioStation CT brochure
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