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JCM 6000 Plus Neoscope

JCM 6000 Plus Neoscope
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NeoScopeJCM-6000Plus N.B. Export of the products* in this catalog is controlled under the Japanese Foreign Exchange and Foreign Trade Law. Appropriate export procedure shall be required in case of export from Japan. 'Products: Hardware and its technical information (including software) Specifications and equipment are subject to change without any notice or obligation on the part of the manufacturer. September 2015 ©2007-15 NIKON CORPORATION WARNING TO ENSURE CORRECT USAGE, READ THE CORRESPONDING MANUALS CAREFULLY BEFORE USING YOUR EQUIPMENT. NIKON CORPORATION Shinagawa Intercity Tower C, 2-15-3, Konan, Minato-ku, Tokyo 108-6290, Japan phone: +81-3-6433-3701 fax: +81-3-6433-3784 http://www.nikon.com/instruments/ NIKON INSTRUMENTS INC. 1300 Walt Whitman Road, Melville, N.Y. 11747-3064, U.S.A. phone: +1-631-547-8500; +1-800-52-NIKON (within the U.S.A. only) fax:+1-631-547-0306 http://www.nikoninstruments.com/ NIKON METROLOGY, INC. 12701 Grand River Avenue, Brighton, Ml 48116 U.S.A. phone: +1-810-220-4360 fax: +1-810-2204300 E-mail: Sales.US.NM@nikon.com http://us.nikonmetrology.com/ http://www.nikoninstruments.com/ NIKON INSTRUMENTS EUROPE B.V. Tripolis 100, Burgerweeshuispad 101,1076 ER Amsterdam, The Netherlands phone: +31-20-7099-000 fax: +31-20-7099-298 http://www.nikoninstruments.eu/ NIKON METROLOGY EUROPE NV Geldenaaksebaan 329,3001 Leuven, Belgium phone: +32-16-74-01-00 fax:+32-16-74-01-03 E-mail: Sales.Europe.NM@nikon.com http://www.nikonmetrology.com/ NIKON INSTRUMENTS (SHANGHAI) CO., LTD. CHINA phone:+86-21-6841-2050 fax:+86-21-6841-2060 (Beijing branch) phone: +86-10-5831-2028 fax: +86-10-5831-2026 (Guangzhou branch) phone: +86-20-3882-0552 fax: +86-20-3882-0580 NIKON SINGAPORE PTE LTD SINGAPORE phone:+65-6559-3618 fax:+65-6559-3668 NIKON MALAYSIA SDN BHD MALAYSIA phone: +60-3-7809-3688 fax: +60-3-7809-3633 PT. NIKON INDONESIA INDONESIA phone: +62-21-574-6262 fax: +62-21-574-6363 NIKON SALES (THAILAND) CO., LTD. THAILAND phone: +66-2633-5100 fax: 66-2633-5191 NIKON INSTRUMENTS KOREA CO., LTD. KOREA phone: +82-2-2186-8400 fax: +82-2-555-4415 NIKON INDIA PRIVATE LIMITED INDIA phone:+91-1244688500 fax:+91-1244688527 NIKON INSTRUMENTS S.pA. ITALY phone: +39-55-300-96-01 fax: +39-55-30-09-93 NIKON GMBH AUSTRIA AUSTRIA phone: +43-1-972-6111-00 fax: +43-1-972-611140 NIKON UK LTD. UNITED KINGDOM phone:+44-208-247-1717 fax:+44-208-5414584 NIKON METROLOGY UK LTD. UNITED KINGDOM phone: +44-1332-811-349 fax: +44-1332-639-881 E-mail: Sales.UK.NM@nikon.com NIKON FRANCE S.AS. FRANCE phone: +33-1451645-16 fax: +33-1451645-55 NIKON METROLOGY SARL FRANCE phone:+33-1-60-86-09-76 fax:+33-1-60-86-57-35 E-mail: Sales.France.NM6nikon.com NIKON GMBH GERMANY phone: +49-211-94142-20 fax:+49-211-94143-22 NIKON METROLOGY GMBH GERMANY phone:+49-6023-91733-0 fax:+49-6023-91733-229 E-mail: Sales.Germany.NM@nikon.com

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Scientific / Metrology Instruments NeoScope JCM-6000Plus JCM-6000Plus is a full-fledged benchtop SEM with versatile functions. Operation via touch panel simplifies execution from observation to analysis. Stylish appearance, compact and lightweight allows for installation in small spaces.

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The Most Advanced Benchtop NeoScope JCM-6000Plus

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NeoScope Simple operation Advanced capabilities High-vacuum/Low-vacuum modes Image search Metrology A wealth of options Elemental analysis Motor drive stage Quick response Easy installation and maintenance

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LOD'seiiVatioml MaintcnancefM) Sample: Iron rust Touch panel & Keyboard/Mouse Operation All controls are at your fingertips. Use the multi-touch monitor or keyboard/mouse for flexible and intuitive operation.

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Automated functionsManual control Auto controls include alignment, focus, stigmator, contrast/ brightness, and Full Auto. A single touch of Full Auto will initiate the entire imaging process to present an image instantly. An item touched and selected will turn green. Hard, continued pressing of the buttons for coarse control. Light, intermittent tapping for fine control. Image search/ display Focus The Display image button is used to search a library of images. Checking the Display image button after selecting a desired image will present a magnified view for closer examination. Minimum...

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Easy Observation Advanced capabilities H S EVmode with a single mouse click. I Observe Switch between High-vacuum mode and Low-vacuum H A wide variety of sample types can be easily observed. S EV I H S EV High-vacuum mode: SEI I HV BEI High-vacuum mode provides secondary electron image (SEI) H and backscattered electron image (BEI). B EV Low-vacuum mode SEI reveals fine structure on sample surfaces. In addition, SEI I H facilitates high magnification observation. B EV HV I LV SEI Search image window V H SEI LV HV SEI LV Print H V HV BEI SEI 08 H V H S EV BEI I Retrieve imaging conditions H...

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H High-vacuum EV S mode: BEI I H A semiconductor backscattered electron detector enables S EV I acquisition of three kinds of BEI information: composition H Analysis Assistant image, Combination with SEI allows the operator to obtain S EV I H complimentary information. B EV I Qualitative/Quantitative H B EV analysis I H B EV I L Low-vacuum mode also allows the operator to easily observe wet, oily or out-gassing samples with minimal sample preparation. Retrieve imaging conditions HV Bmode, which raises the JCM-6000Plus includes Low-vacuum E I H pressure in the specimen chamber to neutralize...

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High-vacuum mode: SEI Low-vacuum mode Search image window The search image window allows the operator to select and print image data. This window also allows the operator to restore the imaging conditions for any stored image. Retrieve imaging conditions Dual frame display Metrology High-vacuum mode: SEI EDS Low-vacuum mode High-vacuum mode: BEI High-vacuum SEI High-vacuum mode: mode: SEI Search image window Analysis Assistant Search image window Low-vacuum Low-vacuum mode mode Print Qualitative/Quantitative analysis Selecting a desired image and pressing the Output images Search Search...

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Print Retrieve imaging conditions Movie observation Dual frame display NeoScope can simultaneously display live and Stored images. In the example below, a low magnification image is presented on the right while a live image is on. This allows the operator to compare a current image with another image retrieved from memory. JCM-6000Plus can acquire a movie. This capability allows observation of dynamic motions. M o v i e s o f l i v e i m a g e a re u s e f u l f o r observation of changes in sample with time. Motor drive stage Tilting and Rotating Motor Drive H Low-vacuum mode BEI...

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