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Automatic Macro Inspection System

AMI-3000 - 21023 AMI-3000

Featuring High Throughput and Exceptional Sensitivity

The AMI-3000 automatic macro inspection system bringstogether all of Nikon’s expertise in semiconductor manufacturing to enhance macro inspection precision, providing quantified reference criteria and enabling more efficient process management. The AMI-3000 offers a substantial increase in yield.

pageCatalog pdf di En 2012-05-22-31