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| | | Microtrak™ II - Versatile, Reliable, Easy to Use | | |
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| | | The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Up to four times faster than traditional CCD units, the Microtrak II is unaffected by surface texture, color or stray light. It can even take accurate measurements through the window of a suction chamber or other contained environment. The Microtrak II is the ideal solution for tough production applications across a wide variety of industries. | | |
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| | | Application Solutions for Quality and Process Control | | |
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| | | Thickness Warpage Alignment Displacement | | • Vibration • Step Height • Shaft Run-out • Go/No-Go Decisions | | • Presence • Fill Height • Flatness • Profiling | | • Thermal Expansion/ Contraction | | |
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| | | Structural Dynamics Dimensional Gaging | | |
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| | | CMOS Sensing Technology Conventional laser displacement sensors monitor the light distribution of a laser spot on a Position Sensitive Detector (PSD). The calculated location of the returned spot is used to determine the position of the target being measured. Uneven distribution of the laser, along with stray reflections from the target, skew the calculated spot location, | | |
| | | causing variations in the measured value. CMOS detectors determine spot position more precisely by monitoring the intensity of light received on a pixel array. Lesser energy reflections from surface scattering are ignored, providing a more accurate and repeatable measurement result. | | |
| | | | | | | | | | | Center of beam | | True peak | | | | spot distribution \ | | >T value | | | | | | \ | | | | | riat | \ | | | | f\Jv - V 1 | | | | | | | | | | |
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| | | Spot on PSD | | |
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| | | | | | | | | | | ^- Peak value | | | | | ^reak value | | | | A A / | \ | | | | | \ | | | | | | | | | | | | | | |
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| | | Spot on CMOS | | |
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| | | Production Quality Control Monitoring | | | | | | |
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