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roughness tester - MITUTOYO


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K-12 Surftest SV-3100 SERIES 178 — Surface Roughness Testers The Surftest SV-3100 Series provides highly accurate, high-level analysis, and multifunctionality in the measurement of surface roughness. FEATURES • Mitutoyo's Surftest SV-3100 Series provide provides highly accurate, high-level analysis, and multi-functionality in three dimensional analysis and measurement of fine contour, as well as the conventional type surface roughness measurement. • Peripheral devices such as the auto-leveling table are available to enhance operability and tenable automatic measurement. • Includes SURFPAK-SV, data analysis software. SURFPAK-SV provides data management in a consistent format, from the work site to the laboratory. • The X-axis drive unit guide is made of superbly anti-abrasive ceramic. No lubrication is required. • High-accuracy glass scales, built-in on the X-axis (resolution: 0.05ėm) and Z2-axis (column, resolution: 1ėm) ensure high accuracy positioning. The SV-3100 series produces high-reliability, particularly in horizontal roughness parameters (S, Sm), that require high-accuracy X-axis travel. • Equipped with a highly accurate detector stylus. SV-3100H4 with personal computer system Technical Data X axis Measuring range: 100mm or 200mm Resolution: 0.05ėm Scale: Linear encoder Drive speed: 0 - 80mm/s Measuring speed: 0.02 - 5mm/s Traverse direction: Backward Traverse linearity: See page K-13 Inclining range: ą45š (with X-axis inclination unit) Z2 axis (column) Vertical travel: 300mm or 500mm, power drive Resolution: 1ėm Scale: ABSOLUTE linear encoder Drive speed: 0 - 20mm/s Detector Range / resolution: 800ėm / 0.01ėm, 80ėm / 0.001ėm, 8ėm / 0.0001ėm (up to 2400ėm with an optional stylus) Measurement method: Skidless / skidded Measuring force: 4mN or 0.75mN (See page K-13) Stylus tip: Diamond, 90š / 5ėmR (60š / 2ėmR: low force type) Type: Differential inductance Base size (W x H): 600 x 450mm or 1000 x 450mm Base material: Granite Dimensions (W x D x H): 756 x 482 x 966mm (S4 type) (Main unit) 756 x 482 x 1166mm (H4 type) 1156 x 482 x 1176mm (W4 type) 766 x 482 x 966mm (S8 type) 766 x 482 x 1166mm (H8 type) 1166 x 482 x 1176mm (W8 type) Mass (Main unit) 140kg (S4 type, S8 type) 150kg (H4 type, H8 type) 220kg (W4 type, W8 type) Evaluation Capability: SURFPAK-SV Assessed profiles P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, envelope residual profile, roughness motif, waviness motif Evaluation parameters Ra, Rq, Rz, Ry, Rz(JIS), Ry(DIN), Rc, Rp, Rpmax, Rpi, Rv, Rvmax, Rvi, Rt, Rti, R3z, R3zi, R3y, S, Pc (Ppi), Sm, HSC, mr, dc, plateau ratio, mrd, Rk, Rpk, Rvk, Mr1, Mr2, Da, Dq, la, lq, Sk, Ku, Lo, Lr, A1, A2 Roughness motif parameters: Rx, R, AR, SR, SAR, NR, NCRX, CPM Waviness motif parameters: Wte, Wx, W, AW SW, SAW, NW Analysis graphs ADC, BAC1, BAC2, power spectrum chart, auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, slope distribution chart, local peak distribution chart, parameter distribution chart Digital filter 2CR-75%, 2CR-50%, 2CR-75% (phase corrected), 2CR-50% (phase corrected), Gaussian-50% Cutoff length* lc: 0.025mm, 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm fl: 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm fh: 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm Sampling 0.025mm, 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm Data compensation functions Tilt compensation, R-plane (curved surface) compensation, ellipse compensation, parabola compensation, hyperbola compensation, quadric curve automatic compensation, polynomial compensation, polynomial automatic compensation * An arbitrary length can also be specified in the range from 0.025mm to the maximum traverse length. • Capabilities include a “straightness compensation” function, which improves the linear accuracy of the X-axis; a “circular compensation” function for the vertical movement of the stylus; and a “stylus-tip diameter compensation” function. • The stylus and the skid are easily replaced. Optional styli and skids are available for a wide variety of roughness measurement applications, such as measurement of small holes, deep holes, etc. • Comes with an easy-to-operate control box independent of the main unit allowing positioning, measurement start/ stop, retracting, and other operations to be performed remotely. The Drive Unit up/ down position and the X-axis traverse can be fine controlled manually. K

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