| | | • Clear and flare less erect Image, wide field of view. • Long working distance objectives, up to 20Xmagnlflcatlon (total: 4000X). • Bhght/Dark-fleld observations, Polarized observation and Differential Interference Contrast (DIC) observation. • Focus and measure using the fine/coarse movement handle with the large-size grips on both sides of the column. | | • Zero-set switches (X- and Y-axis) are also located near the stage feed handles. • Inward type revolverwlth 4 lens mount. • Improved eye level lens for fatigue free | | |
| | | Erect image Siedentoph type (pupil distance adjustment: 51 -76mm), IXtubelens, Binocular tube (depression: 30°), Reticle projection method, w/TVmount,Opticalpath ratio (eyepiece/TV mount: 50/50) 10X(field No.:24mm), Optional: 15X, 20X Manual or power turret M / BD Plan Apo objective from 1Xto 100X (Refer to the page 394 for more details.) Halogen bulb (12V, 50W) Telecentric illumination with adjustable aperture diaphragms Light intensity adjustable, Non-stepped brightness adjustment Optional halogenillumination unit (fiber optic cold light illumination) Koehler illumination with adjustable aperture diaphragms Light intensity adjustable, Non-stepped brightness adjustment 2 axes or 3 axes 0.001mm/0.0005mm/0.0001mm/ .0001" / .00005" / .00001" Zero-setting, Direction switching, Data output(via RS-232C interface) 100/110/120/220/240V AC, 50/60Hz 65.5kg (MF-U_505B, MF-UJ010B), 69.5kg (MF-U_2010B), 130kg (MF-U_2017B), 138kg (MF-U_3017B), 144kg (MF-U_4020B) | | |
| | | Polarized light observation: Observing only the Altered light that vibrates in one direction. Used for observing materials with special optical characteristics, such as mineral and liquid industrial crystal. | | Differential interference contrast (DIC) observation: Effective in detecting fine scratches and steps on the surface of metal, liquid crystal, and semiconductors. | | |