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FS-70
SERIES 378 — Microscope Unit for Semiconductor Inspection
FEATURES
• The optical system that has originally developed for the best seller FS 60 models was further enhanced for the FS70 models. It is ideal as a microscope unit of a prober station for semiconductors. (All models CE marked.)
• The FS70L supports three types of YAG laserwavelength ranges (1064nm, 532nm and 355nm), while the FS70L4 supports two types of wavelength ranges (532nm and 266nm), thus expanding a scope of laser applications, allowing laser-cutting of thin-films used in semiconductors and liquid industrial crystal substrates. However, Mitutoyo assumes no responsibility whatsoever for the performance and/or safety of the laser system used with Mitutoyo industrial microscopes.
a careful examination is recommended in selecting a laser-emission unit.
• Brightfield, Differential Interference Contrast (DIC) and polarized observations are standard with the FS70Z. The FS70L and FS70L4 do not support the DIC method.
• By employing an inward revolver, the long working distance objectives provide excellent operatability.
•An ergonomic design with superb operatability: the FS70 employs the erect-image optical system (the image in the field of view has the same orientation as the specimen) and enlarged fine focus adjustment wheel with rubber grip coarse adjustment knob.
Technical Data
Focus adjustment
• Method: With concentric coarse and fine
focusing wheels (right and left)
• Range: 50mm travel range
0.1mm/rev. for fine adjustment, 3.8mm/rev. for coarse adjustment Trinocular tube Image: Erect image
Pupil distance:
Field number: Tilt angle:
Illumination system:
Siedentopf type, adjustment range: 51 - 76mm 24
0° - 20° (only -TH, -THS models)
Reflective illumination for brightfield
(Koehler illumination, with aperture
12V100Wfiber optics,
non-stepped adjustment),
light guide length 1.5m,
power consumption 150W
M Plan Apo-4, M Plan Apo SL, G Plan
Apo
Light source:
Objectives(optional):
SPECIFICATIONS
Model No. Order No.
FS70
378-184-1
FS70-TH 378-184-3
FS70Z 378-185-1
FS70Z-TH 378-185-3
FS70L 378-186-1
FS70L-TH 378-186-3
FS70L4 378-187-1
FS70L4-TH 378-187-3
Short base model No. Order No.
FS70-S 378-184-2
FS70-THS 378-184-4
FS70Z-S 378-185-2
FS70Z-THS 378-185-4
FS70L-S 378-186-2
FS70L-THS 378-186-4
FS70L4-S 378-187-2
FS70L4-THS 378-187-4
Focus adjustment
50mm travel range with concentric coarse (3.8mm/rev) and fine (0.1mm/rev) focusing wheels (right / left)
Image
Erect image
Pupil distance
Siedentopf type, adjustment range: 51 - 76mm
Field number
24
Tilt angle
0° - 20°
0° - 20°
- 0°- 20°
— 0°- 20°
Optical pass ratio
50/50
100/0 or 0/100
50/50
100/0 or 0/100
100/0 or 0/100
100/0 or 0/100
Protective Alter
Built-in laser beam Alter
Built-in laser beam Alter
Tube lens
1X
1X-2X zoom
1X
1X
Applicable laser
1064/532/355nm
532/355nm
C-mount (using optional adapter B)
UsealaserwithTVport.
C-mount receptacle (with green Alter switch)
Illumination system, optional
Reflective illumination for bright field (Koehler illumination, with aperture diaphragm)
12V 100Wflber optics, non-stepped adjustment, light guide length: 1.5m, power consumption 150W
Objective, optional (for observation)
M Plan Apo, M Plan Apo SL, G Plan Apo
Objective, optional (for laser-cutting)
M/LCD Plan NIR, M/LCD Plan NUV
M Plan UV
Loading weight*
14.5kg
13.6kg
14.1kg
13.2kg
14.5kg
13.6kg
14.1kg
13.2kg
Mass (main unit)
6.1kg
7.1kg
6.6kg
7.5kg
6.1kg
7.1kg
6.6kg
7.5kg
Refer to the Microscope Units leaflet (E4191) for more details.
"Loading weight on optical tube excluding weight of objective lenses and eyepieces
390
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