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Ming Chang Traffic Parts
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| | | excellent chain inspection device for leaf chain charge coopled device | | |
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| | | Safety is the major factor for Leaf Chain due to lift application. Zero defects then is an essential to chain quality. MING CHAIN hascreated an ideal inspection device to avoid chain defects, Charge Coupled Device (CCD Inspection Device), which was been developed after many years of improvement by our QC Dept. CCD is also one of MAXTOP most patented pride development on Quality Control. All our Leaf Chain is CCD inspected after final assembly, complying with the Highest international industry standard. Using the optical photography technique, shadows of chains are connected projected to the computer. CCD computer built-in sensors can then detect all potential defects from received pictures. CCD built-in sensors could be designed to check missing parts, short pins, poor riveting and other possible problems; when chains fail to pass the checking points, failed parts will be recorded and marked to ensure the highest quality of chains. (CCD Inspection, PAT# ZL00205701.8, Certificate# 411 436) | | |
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| | | Overall Result | | |
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| | | | | | | | | | | SoftSensor | Result | < | Output Value > | | | | UP_REF | PASS | Line Offset - 76.38% | | | | UP_R_PIN_REF | PASS | Une Offset = 52 63% | | | | *DN_REF | PASS | Line Offset = 71.87% | | | | UP_R_SHORTPlN | PASS | Bright Area = 0.00% | | | | UP_L_SHORTPIN | PASS | Bright Area = 000% | | | | DN_R_SHORTPIN | PASS | Bright Area = 0 00% | | | | DN_L_SHORTPIN | PASS | Bright Area = 0 00% | | | | UP_PLP | PASS | Bright Area = 0.00% | | | | DN_PLP | PASS | Bright Ar«a = 0 00% | | | | UP_JLP | PASS | Bright Area = 0 00% | | | | MLP | FAIL | Bright Area = 48 81% | | | | DN_JLP | PASS | Bright Area = 0.00% | | | | | | | | | | | | | | | | |
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