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Catalogue General Catalogue - Product Overview

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MICRO EPSILON - 93152, 139458, 89238, 2328

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filmCONTROL

Thickness and profile measurement of flat and blown film

Dynamic measurement

High accuracy and positional resolution

Temperature stability through on-line calibration

No use of isotopes or X-rays

thicknessCONTROL

Material independend thickness

measurement of web and plate materials

Dynamic measurement with high accuracy and high spatial resolution

Rugged mechanical measurement system for harsh industrial environments

No use of isotope or X-ray radiation

dimensionCONTROL

Dimensional routine testing and surface

inspection

Dynamic measurement with high accuracy and resolution

Measurement sensor system independent of material

Sorting according to quality classes

For each measurement task there is a suitable measurement concept: Apart from manufacturer of laser sensors, micrometers, eddy current and manufacturer of capacitive sensors as well as image processing solutions, special combined sensors are also employed. The signal representation can be arranged to suit the requirement. The measurement systems communicate with existing environments over various interfaces and can therefore also be integrated retrospectively into existing production centres.