| | | optris MS Temperature ranges from -32°C up to +760°C Exact measurement of objects as small as 13 mm in any distance less than 140 mm Optical resolution up to 40:1 | | optris LS Portable IR thermometers with patented laser crosshairs Temperature ranges from -35°C up to +900°C Focus of 1 mm spot size for the measurement of finest details Crosshairs mark real spot size at any distance 75:1 optics USB interface and graphic software | | CT fast Extreme fast non-contact temperature measurement Temperature ranges from -40°C to 600°C 10:1 optics Analog outputs 0/4 - 20 mA, 0 - 5/10 V Digital outputs USB, RS232, RS485, CAN, Profibus DP | | |
| | | optris CT Temperature ranges from -40°C up to +900°C One of the smallest infrared sensors worldwide with 22:1 optical resolution, M12 x 28 mm length Rugged and usable up to 180°C ambient temperature without cooling Analog outputs 0/4-20 mA, 0-10 V Digital outputs USB, RS232, RS485, CAN, Profibus DP | | optris CS and optris CSmicro Temperature ranges from -20°C up to +350°C optris CS: Integrated electronics with LED alarm indication and smart electronic sighting support optris CSmicro: Micro size IR sensor M12 x 28 mm length with cable built in electronics Analog output 0-10 V Digital outputs USB, RS232 | | optris CT trans Measuring system for thermal material analysis Combination of miniaturised infrared radiator and optris CT infrared sensor Different modes for evaluation of the material parameter transmissivity, emissivity and reflexion 0-10 V output allows transmission of the determined emissivity to a following CT sensor based infrared temperature measurement with automatic material detection | | |
| | | Trend setting infrared sensor technology for process automation Miniaturised IR sensors optris CT and optris CS combine a high accuracy of the sensor parameters, ruggedness up to 180°C ambient temperature, a state of the art stainless steel mechanical design and an affordable price. New developed IR sensing chips with high sensitivity and small dimensions make outstanding measuring parameters such as | | |