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Detector Selection Guide - Menlo Systems


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Detector Selection Guide

Menlo Systems has developed a series of detectors for lowest light level signals. From avalanche to PIN photodiodes you can find the detector that is best for your specific application. All devices are field tested in our Optical Frequency Comb Systems featuring Nobel Prize winning technology.

PIN PHOTO DETECTORS AVALANCHE PHOTO DETECTORS

APD210, APD310

Avalanche photo detector APD210 in the visible regime and APD310 in the near infrared regime with continuously adjustable gain and high signal-to-noise ratio. Temperature independent gain character- istics through electronic compensation of bias voltage, optimized for detection of low level free space optical pulses in the wavelength range from 400 to 1000 nm and from 850 to 1650 nm with extremely flat frequency response.

FPD310, FPD310-F, FPD310-FV FPD510, FPD510-F, FPD510-FV

The high sensitivity ultrafast PIN photo detector FPD310 product family is optimized for high bandwidth and high signal-to-noise ratio. In the application the gain can be switched between two fixed settings to get optimal performance. Models for both the visible and the near infrared regime are available with free space or fiber coupled optical input. The high sensitivity PIN photo detector FPD510 product family is optimized for highest signal-to- noise ratio when detecting low level optical beat signals at frequencies up to 250 MHz. The units are recommended in particular for applications in metrology where beat signals of weak power have to be detected in a very efficient way.Models for both the visible and the near infrared regime are available with free space or fiber coupled optical input.

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