Reverse View LEED/Auger - LK Technologies - #1

/ 4


catalogue search
Reverse View LEED/Auger - LK Technologies
P. 01
Reverse View LEED/Auger - LK Technologies
P. 02
Reverse View LEED/Auger - LK Technologies
P. 03
Reverse View LEED/Auger - LK Technologies
P. 04
Pages:
Reverse View LEED/Auger - LK Technologies


See other catalogues for LK Technologies

Text version of the page
RSWIVKTITKT|f|f|^H Reverse View LEED/Auger
The LK Technologies Model RVL2000 Reverse View LEED System consists of 4-grid LEED optics, phosphor viewing screen and low-profile electron gun. The optics feature precision alignment with tungsten grids of high transmission (83% per grid) and a viewing angle of 103°. The 1.59 cm diameter electron gun and gun support are designed to minimize interference with LEED observations. Nevertheless, the gun delivers up to 2 uA beam current at 100 eV and up to 50 uA for Auger operation.
The optics may be selected in either fixed or retractable geometry. Fixed optics are available on 8.0 in. or 6.0 in. O.D. CF flanges at standard flange to sample distances of 8.0 or 10.0 in. Retractable optics are available on the 8.0 in. CF flange in two standard versions: a 10 in. sample-to-flange working distance with 2.0 in. travel and an 8.0 in. sample-to-flange working distance with 1.8 in. travel. The optics are translated by a single lead screw on three precision linear bearings internal to the vacuum. The lead screw is in turn driven by a UHV rotary feedthru mounted perpendicular to the optic axis to allow unobstructed viewing of the LEED pattern.
irformance features
Precision construction with 4-grid tungsten optics
Miniature 1.59 cm diameter electron gun
103° usable viewing angle
0.5% energy resolution
Available with retractable optics
Mounting flange has integral viewport and electrical feedthroughs
Fully HUV compatible and bakeable
Low noise, high performance Auger electronics with integral lock-in amplifier
LK
TECHNOLOGIES
Manufacturer of precision instrumentation for surface analysis including electron spectrometers, ion and electron guns, and LEED/Auger systems.

pageCatalog pdf di En 2012-05-22-30